⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL12478868 | 0.87 | — | — | |
| SCHEMBL7952599 | 0.87 | — | — | |
| SCHEMBL9516703 | 0.75 | — | — | |
| SCHEMBL9581162 | 0.75 | — | — | |
| SCHEMBL31561596 | 0.71 | — | — | |
| SCHEMBL14810066 | 0.71 | — | — | |
| SCHEMBL29458715 | 0.71 | — | — | |
| SCHEMBL2480 | 0.71 | — | — | |
| SCHEMBL29424067 | 0.71 | — | — | |
| SCHEMBL29445515 | 0.71 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-6407560-B1 | Thermally-induced voltage alteration for analysis of microelectromechanical devices | SANDIA CORPORATION | 2002-06-18 | — | — | US | claimed |
| US-6078183-A | Thermally-induced voltage alteration for integrated circuit analysis | SANDIA CORPORATION (US) | 2000-06-20 | — | — | US | claimed |
| US-6617862-B1 | Laser intrusive technique for locating specific integrated circuit current paths | ADVANCED MICRO DEVICES, INC. | 2003-09-09 | — | — | US | disclosed |
| US-6549022-B1 | Apparatus and method for analyzing functional failures in integrated circuits | SANDIA CORPORATION | 2003-04-15 | — | — | US | disclosed |
| US-6407560-B1 | Thermally-induced voltage alteration for analysis of microelectromechanical devices | SANDIA CORPORATION | 2002-06-18 | — | — | US | disclosed |
| US-6078183-A | Thermally-induced voltage alteration for integrated circuit analysis | SANDIA CORPORATION (US) | 2000-06-20 | — | — | US | disclosed |