SCHEMBL707008

SCHEMBL707008

ClC(Cl)CCC[SiH2]CC[SiH2]CCCC(Cl)Cl

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL702968 0.94
SCHEMBL704343 0.94
SCHEMBL707287 0.85
SCHEMBL705898 0.81
SCHEMBL704862 0.81
SCHEMBL28966196 0.80
SCHEMBL705590 0.80
SCHEMBL390117 0.78
SCHEMBL6063889 0.75
SCHEMBL390119 0.73

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-115605530-B Polycarbosilazanes and compositions comprising the same and methods of making silicon-containing films using the same 默克专利有限公司 2024-09-27 CN disclosed
US-11999827-B2 Polycarbosilazane, and composition comprising the same, and method for producing silicon-containing film using the same MERCK PATENT GMBH (DE) 2024-06-04 US disclosed
EP-4146725-B1 POLYCARBOSILAZANE, AND COMPOSITION COMPRISING THE SAME, AND METHOD FOR PRODUCING SILICON-CONTAINING FILM USING THE SAME MERCK PATENT GMBH (DE) 2024-05-22 EP disclosed
US-20230174724-A1 POLYCARBOSILAZANE, AND COMPOSITION COMPRISING THE SAME, AND METHOD FOR PRODUCING SILICON-CONTAINING FILM USING THE SAME MERCK PATENT GMBH (DE) 2023-06-08 US disclosed
CN-115605530-A Polycarbosilazanes, compositions comprising the same, and methods of making silicon-containing films using the same 默克专利有限公司(DE) 2023-01-13 CN disclosed
US-8124239-B2 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2012-02-28 US disclosed
US-20100155121-A1 SILICA FILM FORMING MATERIAL, SILICA FILM AND METHOD OF MANUFACTURING THE SAME, MULTILAYER WIRING STRUCTURE AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME FUJITSU LIMITED (JP) 2010-06-24 US disclosed
US-7659357-B2 Precursor organosilicon polymer of 1,2-Bis(dimethylethoxysilyl)ethane, 1,4-bis(dimethylethoxysilyl)benzene, tetraethoxysilane, methyltriethoxysilane, phenyltriethoxysilane; dielectric (DE) films having etching/chemical/moisture resistance; adhesion; low DE constant; minimal wiring delay; high speed FUJITSU LIMITED (JP) 2010-02-09 US disclosed
US-20070026689-A1 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2007-02-01 US disclosed