SCHEMBL759655

SCHEMBL759655

C/C(=C/c1ccccc1)C(=O)/C(C)=C\c1ccccc1

nearest known ligand 0.75

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
AKR1C3 P42330 1/20 0.75
ALDH1A1 P00352 2/20 0.56
TSHR P16473 1/20 0.56
HTT P42858 1/20 0.55
RECQL P46063 1/20 0.52
RAB9A P51151 4/20 0.51
NPC1 O15118 3/20 0.51
SMN1; SMN2 Q16637 2/20 0.51
DHODH Q02127 1/20 0.51
TRPM8 Q7Z2W7 1/20 0.51
MEN1 O00255 2/20 0.50
KMT2A Q03164 2/20 0.50
POLB P06746 2/20 0.50
FBP1 P09467 1/20 0.50
GLA P06280 1/20 0.50
TDP1 Q9NUW8 1/20 0.50
MAPT P10636 1/20 0.50
PKM P14618 1/20 0.49
MAPK1 P28482 1/20 0.49
AKR1C1 Q04828 1/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL759656 1.00 AKR1C3 (0.75) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL4605738 0.91 AKR1C3 (0.76) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL4605744 0.91 AKR1C3 (0.76) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL14047500 0.87 AKR1C3 (0.64) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL37034 0.86 AKR1C3 (1.00) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL2532810 0.86 AKR1C3 (0.75) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL41906 0.86 AKR1C3 (1.00) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL805622 0.86 AKR1C3 (0.75) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL874087 0.86 AKR1C3 (0.75) AKR1C3ALDH1A1TSHRHTTRECQL
SCHEMBL16568719 0.86 AKR1C3 (1.00) AKR1C3ALDH1A1TSHRHTTRECQL

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 24 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0067067-B1 DRY-DEVELOPING NEGATIVE RESIST COMPOSITION FUJITSU LIMITED (JP) 1985-09-25 EP claimed
US-4464455-A Dry-developing negative resist composition FUJITSU LIMITED (JP) 1984-08-07 US claimed
EP-0067067-A2 Dry-developing negative resist composition FUJITSU LIMITED (JP) 1982-12-15 EP claimed
US-8815472-B2 Volume hologram optical recording medium, composition for volume hologram recording layer formation, and volume hologram recording material MITSUBISHI CHEMICAL CORPORATION (JP) 2014-08-26 US disclosed
EP-2077471-B1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR VOLUME HOLOGRAM RECORDING LAYER FORMATION, AND VOLUME HOLOGRAM RECORDING MATERIAL MITSUBISHI CHEM CORP (JP) 2012-07-25 EP disclosed
EP-2063324-B1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR FORMING VOLUME HOLOGRAM RECORDING LAYER, VOLUME HOLOGRAM RECORDING MATERIAL, AND VOLUME HOLOGRAM OPTICAL RECORDING METHOD MITSUBISHI CHEM CORP (JP) 2012-03-21 EP disclosed
US-20100067073-A1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR VOLUME HOLOGRAM RECORDING LAYER FORMATION, AND VOLUME HOLOGRAM RECORDING MATERIAL MITSUBISHI CHEMICAL CORPORATION (JP) 2010-03-18 US disclosed
US-20100039685-A1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR FORMING VOLUME HOLOGRAM RECORDING LAYER, VOLUME HOLOGRAM RECORDING MATERIAL, AND VOLUME HOLOGRAM OPTICAL RECORDING METHOD MITSUBISHI CHEMICAL CORPORATION (JP) 2010-02-18 US disclosed
EP-2077471-A1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR VOLUME HOLOGRAM RECORDING LAYER FORMATION, AND VOLUME HOLOGRAM RECORDING MATERIAL Mitsubishi Chemical Corporation (JP) 2009-07-08 EP disclosed
EP-2063324-A1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR FORMING VOLUME HOLOGRAM RECORDING LAYER, VOLUME HOLOGRAM RECORDING MATERIAL, AND VOLUME HOLOGRAM OPTICAL RECORDING METHOD Mitsubishi Chemical Corporation (JP) 2009-05-27 EP disclosed
US-7368224-B2 High photosensitivity, visible laser recording materials; comprised of novel squarylium compound metal complexes, free radical generators and monomers KYOWA HAKKO CHEMICAL CO., LTD. (JP) 2008-05-06 US disclosed
EP-0573023-B1 Method for manufacturing liquid jet recording head CANON KK (JP) 1998-12-30 EP disclosed
US-5458254-A Method for manufacturing liquid jet recording head CANON KABUSHIKI KAISHA (JP) 1995-10-17 US disclosed
EP-0573023-A1 Method for manufacturing liquid jet recording head CANON KABUSHIKI KAISHA (JP) 1993-12-08 EP disclosed
EP-0140240-B1 PROCESS FOR FORMING AN ORGANIC THIN FILM HITACHI, LTD. (JP) 1988-07-06 EP disclosed
US-4604294-A VACUUM VAPOR DEPOSITION HITACHI, LTD. (JP) 1986-08-05 US disclosed
EP-0067067-B1 DRY-DEVELOPING NEGATIVE RESIST COMPOSITION FUJITSU LIMITED (JP) 1985-09-25 EP disclosed
EP-0140240-A1 Process for forming an organic thin film HITACHI, LTD. (JP) 1985-05-08 EP disclosed
US-4464455-A Dry-developing negative resist composition FUJITSU LIMITED (JP) 1984-08-07 US disclosed
EP-0067067-A2 Dry-developing negative resist composition FUJITSU LIMITED (JP) 1982-12-15 EP disclosed