SCHEMBL759713

SCHEMBL759713

C[C@H](CCC(=O)O)[C@H]1CC[C@H]2[C@@H]3[C@H](O)C[C@@H]4C[C@H](O)CC(C(C)(C)C)[C@]4(C)[C@H]3C[C@H](O)[C@]12C

nearest known ligand 0.71

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
GPBAR1 Q8TDU6 7/20 0.71
CYP3A4 P08684 4/20 0.71
NR1H4 Q96RI1 4/20 0.71
PDE3A Q14432 2/20 0.71
LMNA P02545 2/20 0.66
ABCB11 O95342 3/20 0.59
TDP1 Q9NUW8 2/20 0.58
ALDH1A1 P00352 1/20 0.58
KMT2A Q03164 4/20 0.58
MEN1 O00255 3/20 0.58
SLCO1B3 Q9NPD5 1/20 0.58
SLCO1B1 Q9Y6L6 1/20 0.58
USP2 O75604 1/20 0.58
SLC10A2 Q12908 3/20 0.56
CYP2C19 P33261 1/20 0.56
CHRM2 P08172 1/20 0.56
ADRA2A P08913 1/20 0.56
ADRA1A P35348 1/20 0.56
ENPP2 Q13822 1/20 0.56
SLC10A1 Q14973 1/20 0.56

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Glutarate SCHEMBL2071417 0.97 GPBAR1 (0.68) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL1147290 0.91 GPBAR1 (0.78) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL16252975 0.91 GPBAR1 (0.78) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL1492131 0.91 GPBAR1 (0.78) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL1654286 0.91 GPBAR1 (0.78) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL19650372 0.91 GPBAR1 (0.78) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL16241720 0.91 GPBAR1 (0.78) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL29459591 0.91 GPBAR1 (0.78) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL18424160 0.88 GPBAR1 (0.74) GPBAR1CYP3A4NR1H4PDE3ALMNA
SCHEMBL16057839 0.88 GPBAR1 (0.74) GPBAR1CYP3A4NR1H4PDE3ALMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 27 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7670748-B2 Cyclic compound, photoresist composition and method of forming a photoresist pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2010-03-02 US claimed
US-20070141511-A1 Cyclic compound, photoresist composition and method of forming a photoresist pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-06-21 US claimed
EP-1625447-B1 PHOTOACID GENERATORS WITH PERFLUORINATED MULTIFUNCTIONAL ANIONS 3M INNOVATIVE PROPERTIES CO (US) 2014-04-23 EP disclosed
EP-1556740-B1 IONIC PHOTOACID GENERATORS WITH SEGMENTED HYDROCARBON-FLUOROCARBON SULFONATE ANIONS 3M INNOVATIVE PROPERTIES CO (US) 2012-03-21 EP disclosed
US-7670748-B2 Cyclic compound, photoresist composition and method of forming a photoresist pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2010-03-02 US disclosed
US-7615337-B2 Photoactive resist capping layer INTEL CORPORATION (US) 2009-11-10 US disclosed
US-20070141511-A1 Cyclic compound, photoresist composition and method of forming a photoresist pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-06-21 US disclosed
US-7122294-B2 Photoacid generators with perfluorinated multifunctional anions 3M INNOVATIVE PROPERTIES COMPANY (US) 2006-10-17 US disclosed
US-7078444-B2 Ionic photoacid generators with segmented hydrocarbonfluorocarbon sulfonate anions 3M INNOVATIVE PROPERTIES COMPANY (US) 2006-07-18 US disclosed
US-20060046206-A1 Photoactive resist capping layer INTEL CORPORATION 2006-03-02 US disclosed
EP-0907109-B1 Process for device fabrication using a radiation-sensitive resist material LUCENT TECHNOLOGIES INC (US) 2005-11-16 EP disclosed
EP-1035437-B1 A radiation-sensitive resist material and a process for device fabrication using the same LUCENT TECHNOLOGIES INC (US) 2002-03-27 EP disclosed
US-6296984-B1 PHOTORESISTS LIGHT SENSITIVE LAYERS ON A SUBSTRATE WITH CHROMOPHORE OF IODINIUM AND SULFONIUM GROUPS AGERE SYSTEMS GUARDIAN CORP. 2001-10-02 US disclosed
EP-1130469-A1 A radiation-sensitive resist material and a process for device fabrication using the same LUCENT TECHNOLOGIES INC. (US) 2001-09-05 EP disclosed
US-6258508-B1 PHOTORESISTS KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (KR) 2001-07-10 US disclosed
EP-1035437-A2 A radiation-sensitive resist material and a process for device fabrication using the same LUCENT TECHNOLOGIES INC. (US) 2000-09-13 EP disclosed
US-6013413-A Alicyclic nortricyclene polymers and co-polymers CORNELL RESEARCH FOUNDATION, INC. (US) 2000-01-11 US disclosed
US-5998099-A Energy-sensitive resist material and a process for device fabrication using an energy-sensitive resist material LUCENT TECHNOLOGIES INC. (US) 1999-12-07 US disclosed
EP-0907109-A1 Process for device fabrication using a radiation-sensitive resist material LUCENT TECHNOLOGIES INC. (US) 1999-04-07 EP disclosed
US-5879857-A POLYMER, PHOTOACID GENERATOR, DISSOLUTION INHIBITOR LUCENT TECHNOLOGIES INC. (US) 1999-03-09 US disclosed