SCHEMBL8078330

SCHEMBL8078330

O=C1OC2CCCC2O1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14219148 0.94 PRSS1 (0.32)
SCHEMBL2351624 0.94 PRSS1 (0.32)
SCHEMBL13783610 0.94 PRSS1 (0.32)
SCHEMBL11240661 0.94 PRSS1 (0.32)
SCHEMBL16221630 0.94 PRSS1 (0.32)
SCHEMBL16221696 0.91 KMT2A (0.33)
SCHEMBL8083570 0.91 KMT2A (0.33)
SCHEMBL11351258 0.91 KMT2A (0.33)
SCHEMBL7595334 0.88 PRSS1 (0.34)
SCHEMBL3458350 0.87

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 178 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240210830-A1 RESIST COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-27 US disclosed
US-20230250238-A9 SILICON-CONTAINING COMPOSITION AND METHOD OF PRODUCING SEMICONDUCTOR SUBSTRATE JSR CORPORATION (JP) 2023-08-10 US disclosed
US-11687000-B2 Sulfonium compound, chemically amplified resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-27 US disclosed
US-20230093664-A1 SILICON-CONTAINING COMPOSITION AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE JSR CORPORATION (JP) 2023-03-23 US disclosed
US-20220403116-A1 SILICON-CONTAINING COMPOSITION AND METHOD OF PRODUCING SEMICONDUCTOR SUBSTRATE JSR CORPORATION (JP) 2022-12-22 US disclosed
US-10246605-B2 Resin composition for underlayer film formation, layered product, method for forming pattern, imprint forming kit, and process for producing device FUJIFILM CORPORATION (JP) 2019-04-02 US disclosed
US-9996002-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-06-12 US disclosed
US-9996002-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-06-12 US disclosed
US-9989847-B2 Onium salt compound, resist composition, and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-06-05 US disclosed
US-20180099928-A1 SULFONIUM COMPOUND, RESIST COMPOSITION, AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-04-12 US disclosed
US-20120009529-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-01-12 US disclosed
US-20120009529-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-01-12 US disclosed
US-20100055621-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-03-04 US disclosed
US-20100055621-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-03-04 US disclosed
EP-0846679-B1 Process for preparing 1,3-disubstituted urea SUMIKA FINE CHEMICALS CO LTD (JP) 2000-09-06 EP disclosed
US-5902899-A Process for preparing 1, 3-disubstituted urea SUMIKA FINE CHEMICALS CO., LTD. (JP) 1999-05-11 US disclosed
EP-0846679-A2 Process for preparing 1,3-disubstituted urea SUMIKA FINE CHEMICALS Co., Ltd. (JP) 1998-06-10 EP disclosed
EP-0002526-B1 PROCESS FOR SIMULTANEOUSLY PREPARING 1,3-SUBSTITUTED UREAS AND 1,2-DIOLS BASF Aktiengesellschaft (DE) 1981-09-02 EP disclosed
US-4175137-A Etherified cycloalkanols CIBA-GEIGY CORPORATION (US) 1979-11-20 US disclosed
EP-0002526-A1 Process for simultaneously preparing 1,3-substituted ureas and 1,2-diols BASF Aktiengesellschaft (DE) 1979-06-27 EP disclosed