SCHEMBL108174

SCHEMBL108174

CCOCCC(=O)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15763881 0.95 TSHR (0.52)
Acetic Acid SCHEMBL1626812 0.93 TSHR (0.50)
Ether SCHEMBL27717982 0.91 TSHR (0.48)
SCHEMBL19514117 0.91 GAA (0.50)
SCHEMBL1357249 0.89 TSHR (0.50)
SCHEMBL29258053 0.88 TSHR (0.44)
SCHEMBL4060095 0.87 TSHR (0.67)
SCHEMBL28089954 0.86 TSHR (0.48)
SCHEMBL5835607 0.86 TSHR (0.61)
SCHEMBL3682553 0.84 TSHR (0.63)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 10348 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260147279-A1 DEVELOPER COMPOSITION FOR METAL-CONTAINING PHOTORESIST, AND METHOD OF FORMING PATTERNS INCLUDING DEVELOPING METHOD USING THE COMPOSITION SAMSUNG SDI CO., LTD. (KR) 2026-05-28 US claimed
US-20250388765-A1 Water Washable Ink or Paint CRAYOLA LLC (US) 2025-12-25 US claimed
US-20250377591-A1 PHOTORESIST COMPOSITION AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE SAMSUNG ELECTRONICS CO LTD (KR) 2025-12-11 US claimed
EP-4615891-A1 DSA OF LIQUID CRYSTAL BLOCK COPOLYMERS FOR INTEGRATED CIRCUIT PATTERNING Merck Patent GmbH (DE) 2025-09-17 EP claimed
CN-114995058-B Resin precursor composition, polyimide resin film containing resin precursor composition and application of polyimide resin film 吉林奥来德光电材料股份有限公司 2025-05-06 CN claimed
CN-119781246-A Photosensitive polyimide resin composition, cured film, and preparation method and application thereof 吉林奥来德光电材料股份有限公司 2025-04-08 CN claimed
CN-119620541-A Preparation and application of bottom anti-reflection coating with high etching rate 儒芯微电子材料(上海)有限公司 2025-03-14 CN claimed
US-20250021002-A1 BOTTOM ANTI-REFLECTIVE COATING FOR DEEP ULTRAVIOLET LITHOGRAPHY, PREPARATION METHOD THEREFOR AND USE THEREOF CHINA ADVANCED LITHOGRAPHIC MATERIAL TECHNOLOGY CO. LTD. (CN) 2025-01-16 US claimed
CN-119264321-A Method for regulating and controlling molecular weight change of electronic grade acrylic resin 厦门大学 2025-01-07 CN claimed
CN-112684662-B Black matrix for liquid crystal display device 尚健 2024-12-13 CN claimed
US-6368768-B1 ACRYLATE ESTER COPOLYMER HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. (KR) 2002-04-09 US claimed
US-6183942-B1 CAN BE USED IN WASHING AND REMOVING THE UNNECESSARY SPIN-ON-GLASS (SOG) OF AN SOG LAYER AT EDGES AND BACKSIDE ON SEMICONDUCTOR SUBSTRATES DONGJIN SEMICHEM CO., LTD. (KR) 2001-02-06 US claimed
CN-1271720-A Organic anti reflection paint and its preparation HYUNDAI ELECTRONICS IND (KR) 2000-11-01 CN claimed
CN-1271113-A Diluent composition for removing unnecessary sensitive resin DONGJIN THEMIKAN CO LTD (KR) 2000-10-25 CN claimed
US-6048659-A PHOTOSENSITIVITY, ALKALINITY, QUINONEDIAZIDE AND MONOKETONE JSR CORPORATION (JP) 2000-04-11 US claimed
EP-0907108-A1 Radiation-sensitive resin composition JSR Corporation (JP) 1999-04-07 EP claimed
EP-0408635-B1 TRANSESTERIFICATION OF ALKOXYESTERS EASTMAN KODAK CO (US) 1994-02-23 EP claimed
EP-0408635-A1 TRANSESTERIFICATION OF ALKOXYESTERS. EASTMAN KODAK CO (US) 1991-01-23 EP claimed
US-4898969-A Transesterification of alkoxyesters EASTMAN KODAK COMPANY (US) 1990-02-06 US claimed
WO-1989009762-A1 TRANSESTERIFICATION OF ALKOXYESTERS EASTMAN KODAK COMPANY (US) 1989-10-19 WO claimed