SCHEMBL1101262

SCHEMBL1101262

CC/C=C/CCCC(O)CCCC

nearest known ligand 0.44

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
FFAR1 O14842 3/20 0.44
FFAR4 Q5NUL3 3/20 0.44
ALDH1A1 P00352 4/20 0.38
F7 P08709 3/20 0.38
CYP19A1 P11511 3/20 0.38
F3 P13726 3/20 0.38
KMT2A Q03164 3/20 0.38
PTGS1 P23219 2/20 0.38
PPARG P37231 2/20 0.38
PPARD Q03181 2/20 0.38
PPARA Q07869 2/20 0.38
OXER1 Q8TDS5 2/20 0.38
ADORA3 P0DMS8 1/20 0.38
RXRA P19793 1/20 0.38
NFKB1 P19838 2/20 0.38
NFKB2 Q00653 1/20 0.38
RELA Q04206 1/20 0.38
FAAH O00519 2/20 0.38
MEN1 O00255 2/20 0.36
CYP3A4 P08684 2/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL832707 1.00 FFAR1 (0.44) FFAR1FFAR4ALDH1A1F7CYP19A1
SCHEMBL11293067 0.94 ALDH1A1 (0.47) FFAR1FFAR4ALDH1A1F7CYP19A1
SCHEMBL31436976 0.93 ALDH1A1 (0.42) FFAR1FFAR4ALDH1A1F7CYP19A1
SCHEMBL832638 0.92 FFAR1 (0.53) FFAR1FFAR4ALDH1A1F7CYP19A1
SCHEMBL831059 0.91 FFAR1 (0.46) FFAR1FFAR4F7F3KMT2A
SCHEMBL6135545 0.88 PPARG (0.41) FFAR1FFAR4ALDH1A1PPARGNFKB1
SCHEMBL832347 0.88 PPARG (0.41) FFAR1FFAR4ALDH1A1PPARGNFKB1
SCHEMBL15226796 0.88 FFAR1 (0.57) FFAR1FFAR4KMT2AFAAHMEN1
SCHEMBL8667764 0.87 FFAR1 (0.56) FFAR1FFAR4F7CYP19A1F3
SCHEMBL2576534 0.87 FFAR1 (0.56) FFAR1FFAR4F7CYP19A1F3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7727705-B2 High etch resistant underlayer compositions for multilayer lithographic processes FUJIFILM ELECTRONIC MATERIALS, U.S.A., INC. (US) 2010-06-01 US claimed
WO-2008140846-A1 HIGH ETCH RESISTANT UNDERLAYER COMPOSITIONS FOR MULTILAYER LITHOGRAPHIC PROCESSES FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2008-11-20 WO claimed
US-20080206667-A1 HIGH ETCH RESISTANT UNDERLAYER COMPOSITIONS FOR MULTILAYER LITHOGRAPHIC PROCESSES FUJIFILM ELECTRONIC MATERIALS, U.S.A., INC. 2008-08-28 US claimed
US-8535872-B2 Thermally cured underlayer for lithographic application FUJIFILM ELECTRONIC MATERIALS, U.S.A., INC. (US) 2013-09-17 US disclosed
US-20120178871-A1 THERMALLY CURED UNDERLAYER FOR LITHOGRAPHIC APPLICATION DE BINOD B (US) 2012-07-12 US disclosed
US-8153346-B2 Hydroxyl containing polymer, amino crosslinking agent and thermal acid generator; undercoating for multilayer lithography material FUJIFILM ELECTRONIC MATERIALS, U.S.A., INC. (US) 2012-04-10 US disclosed
US-7727705-B2 High etch resistant underlayer compositions for multilayer lithographic processes FUJIFILM ELECTRONIC MATERIALS, U.S.A., INC. (US) 2010-06-01 US disclosed
WO-2008140846-A1 HIGH ETCH RESISTANT UNDERLAYER COMPOSITIONS FOR MULTILAYER LITHOGRAPHIC PROCESSES FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2008-11-20 WO disclosed
US-20080206667-A1 HIGH ETCH RESISTANT UNDERLAYER COMPOSITIONS FOR MULTILAYER LITHOGRAPHIC PROCESSES FUJIFILM ELECTRONIC MATERIALS, U.S.A., INC. 2008-08-28 US disclosed
US-20080206676-A1 THERMALLY CURED UNDERLAYER FOR LITHOGRAPHIC APPLICATION FUJIFILM ELECTRONIC MATERIALS, U.S.A, INC 2008-08-28 US disclosed
WO-2008103776-A2 THERMALLY CURED UNDERLAYER FOR LITHOGRAPHIC APPLICATION FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2008-08-28 WO disclosed