SCHEMBL118371

SCHEMBL118371

O=C(N[C@@H](Cc1ccc(O)c2ccccc12)C(=O)O)OCC1c2ccccc2-c2ccccc21

nearest known ligand 0.59

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
MDM4 O15151 3/20 0.52
TP53 P04637 3/20 0.52
SLC17A5 Q9NRA2 1/20 0.51
CASP3 P42574 2/20 0.48
PTPN1 P18031 1/20 0.46
MDM2 Q00987 5/20 0.46
EPHX2 P34913 1/20 0.45
KMT2A Q03164 1/20 0.45

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL26980993 0.88 MDM4 (0.52) MDM4TP53SLC17A5CASP3MDM2
SCHEMBL30241105 0.88 MDM4 (0.52) MDM4TP53SLC17A5CASP3MDM2
SCHEMBL26980961 0.88 MDM4 (0.52) MDM4TP53SLC17A5CASP3MDM2
SCHEMBL31369635 0.86 MDM4 (0.50) MDM4TP53SLC17A5CASP3PTPN1
SCHEMBL3725027 0.86 MDM4 (0.53) MDM4TP53SLC17A5CASP3MDM2
SCHEMBL3725031 0.86 MDM4 (0.53) MDM4TP53SLC17A5CASP3MDM2
SCHEMBL29547912 0.86 MDM4 (0.53) MDM4TP53SLC17A5CASP3MDM2
SCHEMBL29397967 0.86 MDM4 (0.53) MDM4TP53SLC17A5CASP3MDM2
SCHEMBL800112 0.86 MDM4 (0.53) MDM4TP53SLC17A5CASP3MDM2
SCHEMBL29401862 0.86 MDM4 (0.53) MDM4TP53SLC17A5CASP3MDM2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8895231-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-25 US disclosed
US-8895231-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-25 US disclosed
US-20120058428-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-08 US disclosed
US-20120058428-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-08 US disclosed