SCHEMBL11964044

SCHEMBL11964044

O=C(OCC1c2ccccc2-c2ccccc21)N(C1CCCCC1)C1CCCCC1

nearest known ligand 0.48

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
KMT2A Q03164 4/20 0.48
EPHX2 P34913 1/20 0.45
FABP5 Q01469 3/20 0.44
FABP7 O15540 2/20 0.44
MEN1 O00255 1/20 0.42
SPHK1 Q9NYA1 1/20 0.40
CA1 P00915 1/20 0.40
CA2 P00918 1/20 0.40
OPRD1 P41143 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2039581 0.85 KMT2A (0.42) KMT2AEPHX2FABP5FABP7CA1
SCHEMBL26632669 0.85 KMT2A (0.44) KMT2AEPHX2FABP5FABP7CA1
SCHEMBL15181329 0.84 KMT2A (0.51) KMT2AEPHX2FABP5FABP7MEN1
SCHEMBL341372 0.83 KMT2A (0.43) KMT2AEPHX2FABP5FABP7OPRD1
SCHEMBL3173765 0.82 KMT2A (0.44) KMT2AEPHX2FABP5FABP7OPRD1
SCHEMBL6013918 0.81 FABP5 (0.44) KMT2AEPHX2FABP5FABP7
SCHEMBL524832 0.81 FABP5 (0.44) KMT2AEPHX2FABP5FABP7
SCHEMBL25797253 0.79 KMT2A (0.41) KMT2AEPHX2FABP5FABP7CA1
SCHEMBL30062804 0.78 FABP5 (0.57) KMT2AEPHX2FABP5FABP7CA1
SCHEMBL28659758 0.78 FABP5 (0.45) KMT2AEPHX2FABP5FABP7OPRD1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 15 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8507175-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-08-13 US disclosed
US-8426115-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-04-23 US disclosed
US-8426115-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-04-23 US disclosed
US-20120202158-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-08-09 US disclosed
US-20120202158-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-08-09 US disclosed
US-20110091812-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-04-21 US disclosed
US-20110091812-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-04-21 US disclosed
US-20110033803-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-02-10 US disclosed
US-20110033803-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-02-10 US disclosed
US-7718343-B2 Decomposable resin composition and pattern-forming material including the same FUJIFILM CORPORATION (JP) 2010-05-18 US disclosed
US-7718343-B2 Decomposable resin composition and pattern-forming material including the same FUJIFILM CORPORATION (JP) 2010-05-18 US disclosed
US-7402374-B2 Method for colored image formation FUJIFILM CORPORATION (JP) 2008-07-22 US disclosed
US-7402374-B2 Method for colored image formation FUJIFILM CORPORATION (JP) 2008-07-22 US disclosed
US-20080070154-A1 DECOMPOSABLE RESIN COMPOSITION AND PATTERN-FORMING MATERIAL INCLUDING THE SAME FUJIFILM CORPORATION (JP) 2008-03-20 US disclosed
US-20080070154-A1 DECOMPOSABLE RESIN COMPOSITION AND PATTERN-FORMING MATERIAL INCLUDING THE SAME FUJIFILM CORPORATION (JP) 2008-03-20 US disclosed