SCHEMBL12015356

SCHEMBL12015356

CC(=O)OC1CC2C(=O)N(C(=O)C(C)(C)C)C2C1

nearest known ligand 0.35

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CHRM2 P08172 3/20 0.35
CHRM4 P08173 3/20 0.35
CHRM1 P11229 3/20 0.35
CHRM3 P20309 3/20 0.35
CHRM5 P08912 2/20 0.35
POLB P06746 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12015377 0.92 CHRM2 (0.33) CHRM2CHRM4CHRM1CHRM3CHRM5
SCHEMBL12764327 0.79 CHRM2 (0.35) CHRM2CHRM4CHRM1CHRM3CHRM5
SCHEMBL12764325 0.78 CHRM2 (0.34) CHRM2CHRM4CHRM1CHRM3CHRM5
SCHEMBL12015344 0.76 CHRM2 (0.30) CHRM2CHRM1CHRM3
SCHEMBL12015375 0.76
SCHEMBL12015373 0.76
SCHEMBL12015345 0.75
SCHEMBL12017038 0.74 CHRM2 (0.31) CHRM2CHRM4CHRM1CHRM3CHRM5
SCHEMBL12015353 0.73 RIPK1 (0.37)
SCHEMBL12015372 0.72 CHRM2 (0.32) CHRM2CHRM4CHRM1CHRM3CHRM5

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9405191-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-02 US disclosed
US-20160077433-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-17 US disclosed
US-8859182-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2014-10-14 US disclosed
US-8563217-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-10-22 US disclosed
US-20130022910-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-01-24 US disclosed
US-20120219907-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed
US-20120219898-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed