SCHEMBL12120237

SCHEMBL12120237

CCCCCC(=O)OCCN(CCOC(=O)CCCCC)CCOC(=O)CCCCC

nearest known ligand 0.73

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
DNM1 Q05193 1/20 0.73
DGKA P23743 1/20 0.70
PAM P19021 2/20 0.53
TSHR P16473 1/20 0.50
MAPT P10636 1/20 0.50
PRSS1 P07477 1/20 0.50
PRSS2 P07478 1/20 0.50
PRSS3 P35030 1/20 0.50
LMNA P02545 3/20 0.49
ALDH1A1 P00352 1/20 0.49
NAAA Q02083 1/20 0.48
KDM4E B2RXH2 1/20 0.47
DUSP3 P51452 1/20 0.47
MEN1 O00255 1/20 0.47
KMT2A Q03164 1/20 0.47
HTR2C P28335 1/20 0.47
MGLL Q99685 1/20 0.46

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9716983 0.98 DNM1 (0.77) DNM1DGKAPAMTSHRMAPT
SCHEMBL17401273 0.98 DNM1 (0.77) DNM1DGKAPAMTSHRMAPT
SCHEMBL12120239 0.98 DNM1 (0.77) DNM1DGKAPAMTSHRMAPT
SCHEMBL17401271 0.98 DNM1 (0.77) DNM1DGKAPAMTSHRMAPT
SCHEMBL17401272 0.98 DNM1 (0.77) DNM1DGKAPAMTSHRMAPT
SCHEMBL12120241 0.98 DNM1 (0.77) DNM1DGKAPAMTSHRMAPT
SCHEMBL17401268 0.96 DNM1 (0.74) DNM1DGKAPAMTSHRMAPT
SCHEMBL17401266 0.96 DNM1 (0.74) DNM1DGKAPAMTSHRMAPT
SCHEMBL17401264 0.96 DNM1 (0.74) DNM1DGKAPAMTSHRMAPT
SCHEMBL17401265 0.96 DNM1 (0.74) DNM1DGKAPAMTSHRMAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 12 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8057981-B2 Resist composition, resist protective coating composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-11-15 US disclosed
US-8057981-B2 Resist composition, resist protective coating composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-11-15 US disclosed
US-7759047-B2 Resist protective film composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-07-20 US disclosed
US-7759047-B2 Resist protective film composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-07-20 US disclosed
US-7670750-B2 Polymer, resist protective coating material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-03-02 US disclosed
US-7670750-B2 Polymer, resist protective coating material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-03-02 US disclosed
US-20090208867-A1 Resist Composition, Resist Protective Coating Composition, and Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-08-20 US disclosed
US-20090208867-A1 Resist Composition, Resist Protective Coating Composition, and Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-08-20 US disclosed
US-20080085466-A1 Polymer, resist protective coating material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-04-10 US disclosed
US-20080085466-A1 Polymer, resist protective coating material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-04-10 US disclosed
US-20070275326-A1 Resist protective film composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-11-29 US disclosed
US-20070275326-A1 Resist protective film composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-11-29 US disclosed