SCHEMBL1226953

SCHEMBL1226953

C1CCCC[SiH2]CCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1226137 1.00
SCHEMBL400344 1.00
SCHEMBL400244 1.00
SCHEMBL12272287 1.00
Hydrochloric Acid SCHEMBL27779801 0.95
SCHEMBL28295899 0.95
SCHEMBL27576289 0.95
SCHEMBL28218386 0.95
SCHEMBL31243568 0.95
SCHEMBL27949066 0.95

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 28 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9343293-B2 Flowable silicon—carbon—oxygen layers for semiconductor processing APPLIED MATERIALS, INC. (US) 2016-05-17 US claimed
US-20140302688-A1 FLOWABLE SILICON-CARBON-OXYGEN LAYERS FOR SEMICONDUCTOR PROCESSING APPLIED MATERIALS, INC. (US) 2014-10-09 US claimed
US-20130217239-A1 FLOWABLE SILICON-AND-CARBON-CONTAINING LAYERS FOR SEMICONDUCTOR PROCESSING APPLIED MATERIALS, INC. (US) 2013-08-22 US claimed
US-20130217240-A1 FLOWABLE SILICON-CARBON-NITROGEN LAYERS FOR SEMICONDUCTOR PROCESSING APPLIED MATERIALS, INC. (US) 2013-08-22 US claimed
WO-2013036667-A2 FLOWABLE SILICON-CARBON-NITROGEN LAYERS FOR SEMICONDUCTOR PROCESSING APPLIED MATERIALS, INC. (US) 2013-03-14 WO claimed
US-9343293-B2 Flowable silicon—carbon—oxygen layers for semiconductor processing APPLIED MATERIALS, INC. (US) 2016-05-17 US disclosed
US-20150140833-A1 METHOD OF DEPOSITING A LOW-TEMPERATURE, NO-DAMAGE HDP SIC-LIKE FILM WITH HIGH WET ETCH RESISTANCE APPLIED MATERIALS, INC. 2015-05-21 US disclosed
US-20140302688-A1 FLOWABLE SILICON-CARBON-OXYGEN LAYERS FOR SEMICONDUCTOR PROCESSING APPLIED MATERIALS, INC. (US) 2014-10-09 US disclosed
US-20130217241-A1 TREATMENTS FOR DECREASING ETCH RATES AFTER FLOWABLE DEPOSITION OF SILICON-CARBON-AND-NITROGEN-CONTAINING LAYERS APPLIED MATERIALS, INC. (US) 2013-08-22 US disclosed
US-20130217239-A1 FLOWABLE SILICON-AND-CARBON-CONTAINING LAYERS FOR SEMICONDUCTOR PROCESSING APPLIED MATERIALS, INC. (US) 2013-08-22 US disclosed
US-20130217243-A1 DOPING OF DIELECTRIC LAYERS APPLIED MATERIALS, INC. (US) 2013-08-22 US disclosed
US-20130217240-A1 FLOWABLE SILICON-CARBON-NITROGEN LAYERS FOR SEMICONDUCTOR PROCESSING APPLIED MATERIALS, INC. (US) 2013-08-22 US disclosed
EP-1836238-A1 FUNCTIONALIZED POLYMERS AND IMPROVED TIRES THEREFROM Bridgestone Corporation (JP) 2007-09-26 EP disclosed
US-20070164261-A1 Liquid for immersion exposure and immersion exposure method JSR CORPORATION (JP) 2007-07-19 US disclosed
EP-1748469-A1 LIQUID FOR IMMERSION EXPOSURE AND IMMERSION EXPOSURE METHOD JSR Corporation (JP) 2007-01-31 EP disclosed
US-20060173138-A1 particularly tire treads exhibiting reduced rolling resistance; include a primary or secondary amine group and a silicon-containing or tin-containing group at or near at least one end of a polymer chain BRIDGESTONE CORPORATION (JP) 2006-08-03 US disclosed
WO-2006076629-A1 FUNCTIONALIZED POLYMERS AND IMPROVED TIRES THEREFROM BRIDGESTONE CORPORATION (JP) 2006-07-20 WO disclosed
EP-0459499-B1 Process for preparing silacycloalkanes DOW CORNING (US) 1999-05-26 EP disclosed
EP-0459499-A1 Process for preparing silacycloalkanes DOW CORNING CORPORATION (US) 1991-12-04 EP disclosed
US-4973723-A REACTING HALOSILACYCLOALKANE WIT ALKYLALUMINUM HALIDE DOW CORNING CORPORATION (US) 1990-11-27 US disclosed