SCHEMBL12460273

SCHEMBL12460273

O=C(OCC1CO1)C1CC(C(=O)OCC2CO2)CC(C(=O)OC[C@@H]2CO2)C1

nearest known ligand 0.60

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
TP53 P04637 1/20 0.60
CYP3A4 P08684 1/20 0.60
ALDH1A1 P00352 1/20 0.50
MGLL Q99685 3/20 0.39
TSHR P16473 1/20 0.37
LMNA P02545 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2754958 1.00 TP53 (0.60) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL1277836 0.92 TP53 (0.61) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL12133586 0.91 TP53 (0.56) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL284818 0.88 TP53 (0.62) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL9347713 0.87 TP53 (0.66) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL7656832 0.87 TP53 (0.66) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL7860984 0.87 TP53 (0.66) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL285188 0.87 TP53 (0.66) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL25475695 0.86 TP53 (0.47) TP53CYP3A4ALDH1A1MGLLTSHR
SCHEMBL3222563 0.86 TP53 (0.47) TP53CYP3A4ALDH1A1MGLLTSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20160349620-A1 METHOD OF FORMING PATTERN AND DEVELOPER FOR USE IN THE METHOD FUJIFILM CORPORATION (JP) 2016-12-01 US disclosed
US-8808965-B2 Pattern forming method, pattern, chemical amplification resist composition and resist film FUJIFILM CORPORATION (JP) 2014-08-19 US disclosed
US-20120288691-A1 PATTERN FORMING METHOD, PATTERN, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM FUJIFILM CORPORATION (JP) 2012-11-15 US disclosed
WO-2011083872-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM FUJIFILM CORPORATION (JP) 2011-07-14 WO disclosed