SCHEMBL13012012

SCHEMBL13012012

O=C(OC1C2CC3OS(=O)(=O)C1C3O2)C(F)(F)S(=O)(=O)O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13011840 0.87
SCHEMBL13011922 0.85
SCHEMBL16708367 0.84
SCHEMBL10099530 0.81
SCHEMBL22399892 0.79
SCHEMBL13012009 0.77
SCHEMBL13011331 0.76
SCHEMBL15854511 0.76
SCHEMBL13011298 0.74
SCHEMBL15081155 0.73

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10766992-B2 Resin and resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-09-08 US disclosed
US-9996008-B2 Photoresist pattern trimming methods ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2018-06-12 US disclosed
US-9666436-B2 Ion implantation methods ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2017-05-30 US disclosed
US-20170045822-A1 PHOTORESIST PATTERN TRIMMING METHODS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2017-02-16 US disclosed
US-20170045822-A1 PHOTORESIST PATTERN TRIMMING METHODS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2017-02-16 US disclosed
US-9051405-B2 Resin and resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-06-09 US disclosed
US-20150132698-A1 RESIN AND RESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-05-14 US disclosed
US-20140187027-A1 ION IMPLANTATION METHODS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2014-07-03 US disclosed
US-20130171574-A1 PHOTORESIST PATTERN TRIMMING METHODS ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2013-07-04 US disclosed
US-20100323296-A1 RESIN AND RESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-12-23 US disclosed