SCHEMBL1304240

SCHEMBL1304240

COC(=O)OCCN

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6324162 0.88 SOAT1 (0.42)
SCHEMBL24311035 0.86 ALDH1A1 (0.35)
SCHEMBL1449854 0.83 ALDH1A1 (0.40)
SCHEMBL47896 0.83 SMN1; SMN2 (0.41)
SCHEMBL15689729 0.81 PAOX (0.47)
Hydrochloric Acid SCHEMBL28664937 0.80 IDO1 (0.39)
SCHEMBL14740733 0.80 ALDH1A1 (0.38)
SCHEMBL28633091 0.80 ALDH1A1 (0.45)
Ammonia Solution, Strong SCHEMBL27695494 0.80 ALDH1A1 (0.38)
Water SCHEMBL18426253 0.80 SMN1; SMN2 (0.39)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 39 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119955091-A Polymer, positive-type negative-type photosensitive resin composition, pattern forming method, cured film forming method, interlayer insulating film, surface protective film, and electronic component 信越化学工业株式会社 2025-05-09 CN disclosed
CN-115044040-B Polyimide-containing polymer, positive photosensitive resin composition, negative photosensitive resin composition, and pattern forming method 信越化学工业株式会社 2024-07-02 CN disclosed
CN-111381447-B Photosensitive resin composition, laminate, and pattern forming method 信越化学工业株式会社 2024-03-08 CN disclosed
CN-109388023-B Photosensitive resin composition, photosensitive resin coating, photosensitive dry film, laminate, and pattern forming method 信越化学工业株式会社 2023-12-22 CN disclosed
CN-109388022-B Silicone-structure-containing polymer, photosensitive resin composition, photosensitive resin coating layer, photosensitive dry film, laminate, and pattern forming method 信越化学工业株式会社 2023-07-28 CN disclosed
CN-108388082-B Photosensitive resin composition, photosensitive dry film, photosensitive resin coating and pattern forming method 信越化学工业株式会社(JP) 2023-01-13 CN disclosed
CN-108459469-B Pattern forming method 信越化学工业株式会社 2022-11-11 CN disclosed
CN-108373856-B Laminate and pattern forming method 信越化学工业株式会社 2022-07-01 CN disclosed
CN-110016136-A Novel tetracarboxylic dianhydride, polyimide resin and its manufacturing method, photosensitive resin composition, pattern forming method 信越化学工业株式会社 2019-07-16 CN disclosed
CN-109422881-A Containing the isocyanurate-modified organic siliconresin of epoxy group, photosensitive resin composition, photo-conductive film, laminated body and pattern forming method 信越化学工业株式会社 2019-03-05 CN disclosed
EP-2169021-A1 Ink composition, inkjet recording method, and printed material Fujifilm Corporation (JP) 2010-03-31 EP disclosed
US-20100075119-A1 INK COMPOSITION, INKJET RECORDING METHOD, AND PRINTED MATERIAL FUJIFILM CORPORATION (JP) 2010-03-25 US disclosed
EP-1882724-B1 Ink composition, inkjet recording method, printed material, and process for producing lithographic printing plate FUJIFILM CORP (JP) 2008-12-03 EP disclosed
US-20080286484-A1 INK COMPOSITION, INKJET RECORDING METHOD, AND PRINTED MATERIAL FUJIFILM CORPORATION (JP) 2008-11-20 US disclosed
EP-1958788-A1 Ink composition, inkjet recording method, and printed material FUJIFILM Corporation (JP) 2008-08-20 EP disclosed
US-20080074480-A1 INK COMPOSITION, INKJET RECORDING METHOD, AND PRINTED MATERIAL FUJIFILM CORPORATION (JP) 2008-03-27 US disclosed
EP-1903080-A1 Ink composition, inkjet recording method, and printed material FUJIFILM Corporation (JP) 2008-03-26 EP disclosed
US-20080063981-A1 Ink composition, inkjet recording method, printed material, and process for producing lithographic printing plate FUJIFILM CORPORATION (JP) 2008-03-13 US disclosed
EP-1882724-A1 Ink composition, inkjet recording method, printed material, and process for producing lithographic printing plate FUJIFILM Corporation (JP) 2008-01-30 EP disclosed
EP-1693707-A1 Positive resist composition, and patterning process using the same Shinetsu Chemical Co., Ltd. (JP) 2006-08-23 EP disclosed