SCHEMBL132094

SCHEMBL132094

CCC1(OC(=O)C(C)(C)CC)CCC(C)CC1

nearest known ligand 0.32

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
HMGCR P04035 2/20 0.32
KDM4E B2RXH2 1/20 0.32
CYP2C9 P11712 1/20 0.31
CYP2C19 P33261 1/20 0.31
RIPK1 Q13546 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL132884 0.91 CYP1A2 (0.31)
SCHEMBL13607370 0.86
SCHEMBL132093 0.86 KDM4E (0.36) KDM4ECYP2C9CYP2C19
SCHEMBL16900294 0.84 KDM4E (0.37) KDM4E
SCHEMBL17539211 0.83
SCHEMBL17532395 0.83
SCHEMBL16900293 0.83 HMGCR (0.30) HMGCR
SCHEMBL12202235 0.83 HMGCR (0.32) HMGCR
SCHEMBL47494 0.83 HMGCR (0.32) HMGCR
SCHEMBL15473008 0.82 CYP1A2 (0.39) HMGCRKDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9052594-B2 Positive photosensitive composition and method of forming pattern using the same FUJIFILM CORPORATION (JP) 2015-06-09 US disclosed
US-9017931-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-04-28 US disclosed
US-20140051026-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-20 US disclosed
US-20120058431-A1 POSITIVE PHOTOSENSITIVE COMPOSITION AND METHOD OF FORMING PATTERN USING THE SAME FUJIFILM CORPORATION (JP) 2012-03-08 US disclosed
US-20070172761-A1 Positive photosensitive composition and method of forming pattern using the same FUJIFILM CORPORATION (JP) 2007-07-26 US disclosed