SCHEMBL13375780

SCHEMBL13375780

C=CC(=O)OCC1=COC1

nearest known ligand 0.39

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
TSHR P16473 7/20 0.39
ALDH1A1 P00352 4/20 0.39
TP53 P04637 3/20 0.39
HIF1A Q16665 3/20 0.39
CYP3A4 P08684 2/20 0.39
HSD17B10 Q99714 1/20 0.39
THRB P10828 3/20 0.38
MAPK1 P28482 1/20 0.36
SMN1; SMN2 Q16637 1/20 0.36
HPGD P15428 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8735755 0.75
SCHEMBL15802756 0.71 TSHR (0.41) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL301811 0.70 GSTP1 (0.40) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL2556244 0.70 HCAR2 (0.50) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL21913948 0.70 TSHR (0.46) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL25402825 0.69 TSHR (0.42) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL22009213 0.69 THRB (0.43) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL13945599 0.69 THRB (0.43) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL29577996 0.67 THRB (0.53) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL10451653 0.67 THRB (0.53) TSHRALDH1A1TP53HIF1ACYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8288072-B2 Antireflection film; fast etching speed whcih reduces deformation; accuracy; 2,3-epoxypropyl methacrylate ester-styrene copolymer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-10-16 US disclosed
US-7687228-B2 Antireflection film composition and patterning process using the same SHIN ETSU CHEMICAL CO., LTD. (JP) 2010-03-30 US disclosed
US-20080227037-A1 Resist lower layer film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-18 US disclosed
US-20080220381-A1 Antireflection film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-11 US disclosed