SCHEMBL13477462

SCHEMBL13477462

O=S(=O)(NCCCCS)C(F)(F)F

nearest known ligand 0.62

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
EPHX1 P07099 1/20 0.62
CA2 P00918 5/20 0.39
CA1 P00915 4/20 0.39
CNR1 P21554 1/20 0.36
CNR2 P34972 1/20 0.36
NPY5R Q15761 1/20 0.35
IDO1 P14902 1/20 0.33
MEN1 O00255 1/20 0.33
HTT P42858 1/20 0.33
KMT2A Q03164 1/20 0.33
GRIA1 P42261 3/20 0.31
CA7 P43166 1/20 0.31
CA13 Q8N1Q1 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13477464 0.84 EPHX1 (0.52) EPHX1CA2CA1CNR1CNR2
SCHEMBL1260720 0.80 EPHX1 (0.64) EPHX1CA2CA1CNR1CNR2
SCHEMBL7870212 0.78 EPHX1 (0.62) EPHX1CA2CA1CNR1CNR2
SCHEMBL1321109 0.78 EPHX1 (0.96) EPHX1CA2CA1CA7
SCHEMBL1260722 0.78 EPHX1 (0.62) EPHX1CA2CA1CNR1CNR2
SCHEMBL12789664 0.78 EPHX1 (0.60) EPHX1CA2CA1CNR1CNR2
SCHEMBL15904262 0.77 EPHX1 (0.61) EPHX1CA2CA1CNR1CNR2
SCHEMBL1319040 0.77 EPHX1 (1.00) EPHX1CA2CA1CA7
SCHEMBL1319861 0.77 EPHX1 (1.00) EPHX1CA2CA1CA7
SCHEMBL1318327 0.77 EPHX1 (1.00) EPHX1CA2CA1CA7

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7666572-B2 Resist top coat composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-02-23 US disclosed
US-7666572-B2 Resist top coat composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-02-23 US disclosed
US-20070298355-A1 Resist top coat composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-12-27 US disclosed
US-20070298355-A1 Resist top coat composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-12-27 US disclosed