SCHEMBL1493055

SCHEMBL1493055

O[Si](O[SiH3])(O[SiH3])O[SiH3]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28582994 0.76
SCHEMBL339997 0.74
SCHEMBL16864904 0.71
SCHEMBL12458659 0.70
SCHEMBL11627139 0.67
SCHEMBL387955 0.67
SCHEMBL4589963 0.67
Methane SCHEMBL8570500 0.64
SCHEMBL12458655 0.64
SCHEMBL7060897 0.64

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 17 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8765887-B2 Process and catalyst system for polydiene production BRIDGESTONE CORPORATION (JP) 2014-07-01 US claimed
US-8951711-B2 Patterning process and composition for forming silicon-containing film usable therefor SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-02-10 US disclosed
US-20140342289-A1 PATTERNING PROCESS AND COMPOSITION FOR FORMING SILICON-CONTAINING FILM USABLE THEREFOR SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-20 US disclosed
EP-2470574-B1 PROCESS AND CATALYST SYSTEM FOR POLYDIENE PRODUCTION BRIDGESTONE CORP (JP) 2014-09-17 EP disclosed
US-8835102-B2 Patterning process and composition for forming silicon-containing film usable therefor SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-16 US disclosed
US-8765887-B2 Process and catalyst system for polydiene production BRIDGESTONE CORPORATION (JP) 2014-07-01 US disclosed
US-20120238095-A1 PATTERNING PROCESS AND COMPOSITION FOR FORMING SILICON-CONTAINING FILM USABLE THEREFOR SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-09-20 US disclosed
EP-2470574-A2 PROCESS AND CATALYST SYSTEM FOR POLYDIENE PRODUCTION Bridgestone Corporation (JP) 2012-07-04 EP disclosed
US-20120165484-A1 PROCESS AND CATALYST SYSTEM FOR POLYDIENE PRODUCTION BRIDGESTONE CORPORATION (JP) 2012-06-28 US disclosed
WO-2011028523-A2 PROCESS AND CATALYST SYSTEM FOR POLYDIENE PRODUCTION BRIDGESTONE CORPORATION (JP) 2011-03-10 WO disclosed
US-7884176-B2 dispersing TS(TEOS-SiO2) or APTES/TEOS-SiO2 (TAS) in solvent so as to form TS solution or TAS solution; adding triphenylolmethane triglycidyl ether and 1,4-butanediol diglycidyl ether into the TS solution or TAS solution to produce glycidyl ether/TS solution or glycidyl ether/TAS solution, curing CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY, ARMAMENTS BUREAU, M.N.D. (TW) 2011-02-08 US disclosed
US-20100283133-A1 FILM-FORMING COMPOSITION, INSULATING FILM WITH LOW DIELECTRIC CONSTANT, FORMATION METHOD THEREOF, AND SEMICONDUCTOR DEVICE HAMADA YOSHITAKA 2010-11-11 US disclosed
US-7786022-B2 Method for forming insulating film with low dielectric constant SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-08-31 US disclosed
US-20090093611-A1 Epoxy/modified silicon dioxide corrosion resistant nanocomposite material and preparation method thereof NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (TW) 2009-04-09 US disclosed
US-20080290472-A1 SEMICONDUCTOR INTERLAYER-INSULATING FILM FORMING COMPOSITION, PREPARATION METHOD THEREOF, FILM FORMING METHOD, AND SEMICONDUCTOR DEVICE SHIN ETSU CHEMICAL CO., LTD. 2008-11-27 US disclosed
US-20080290521-A1 FILM-FORMING COMPOSITION, INSULATING FILM WITH LOW DIELECTRIC CONSTANT, FORMATION METHOD THEREOF, AND SEMICONDUCTOR DEVICE SHIN ETSU CHEMICAL CO., LTD. 2008-11-27 US disclosed
US-20080292863-A1 SILOXANE POLYMER, PREPARATION METHOD THEREOF, POROUS-FILM FORMING COATING SOLUTION CONTAINING THE POLYMER, POROUS FILM, AND SEMICONDUCTOR DEVICE USING THE POROUS FILM SHIN ETSU CHEMICAL CO., LTD. 2008-11-27 US disclosed