SCHEMBL157394

SCHEMBL157394

COC(C)(C)CCC(C)C(=O)O

nearest known ligand 0.45

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
GABRR1 P24046 2/20 0.45
CYP1A2 P05177 1/20 0.45
BLM P54132 1/20 0.39
ACE2 Q9BYF1 1/20 0.37
ALDH1A1 P00352 2/20 0.36
TDP1 Q9NUW8 2/20 0.36
LMNA P02545 1/20 0.36
CYP3A4 P08684 1/20 0.36
LTA4H P09960 1/20 0.36
ACACB O00763 1/20 0.33
ACACA Q13085 1/20 0.33
TSHR P16473 1/20 0.32
FOLH1 Q04609 2/20 0.31
NAALAD2 Q9Y3Q0 2/20 0.31
ENPEP Q07075 2/20 0.31
MEN1 O00255 1/20 0.30
GAA P10253 1/20 0.30
KMT2A Q03164 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16897672 0.90 BLM (0.47) GABRR1CYP1A2BLMACE2ALDH1A1
SCHEMBL20825478 0.85 ACE2 (0.44) GABRR1CYP1A2BLMACE2ALDH1A1
SCHEMBL27868134 0.83 GABRR1 (0.45) GABRR1CYP1A2BLMACE2LTA4H
SCHEMBL28496019 0.79 CYP3A4 (0.34) ALDH1A1TDP1LMNACYP3A4TSHR
SCHEMBL3753790 0.78 GABRR1 (0.52) GABRR1CYP1A2BLMACE2LTA4H
SCHEMBL27286922 0.78 GABRR1 (0.52) GABRR1CYP1A2BLMACE2LTA4H
Acetic Acid SCHEMBL31288634 0.78 TDP1 (0.41) ALDH1A1TDP1LMNACYP3A4TSHR
SCHEMBL986918 0.76 CA2 (0.53) ALDH1A1TDP1TSHRMEN1GAA
SCHEMBL10595182 0.76 GABRR1 (0.42) GABRR1CYP1A2BLMACE2LTA4H
SCHEMBL28466762 0.76 GABRR1 (0.50) GABRR1CYP1A2BLMACE2LTA4H

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 313 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-4804577-B2 2011-11-02 JP claimed
US-20100085518-A1 PHOTO-SENSITIVE RESIN COMPOSITION FOR BLACK MATRIX, BLACK MATRIX PRODUCED BY THE COMPOSITION AND LIQUID CRYSTAL DISPLAY INCLUDING THE BLACK MATRIX LG CHEM, LTD. (KR) 2010-04-08 US claimed
WO-2008102990-A1 PHOTO-SENSITIVE RESIN COMPOSITION FOR BLACK MATRIX, BLACK MATRIX PRODUCED BY THE COMPOSITION AND LIQUID CRYSTAL DISPLAY INCLUDING THE BLACK MATRIX LG CHEM, LTD. (KR) 2008-08-28 WO claimed
WO-2008078953-A1 BLACK MATRIX HIGH SENSITIVE PHOTORESIST COMPOSITION FOR LIQUID CRYSTAL DISPLAY AND BLACK MATRIX PREPARED BY USING THE SAME LG CHEM, LTD. (KR) 2008-07-03 WO claimed
EP-0260994-B1 PROCESS FOR PRODUCING INTEGRATED CIRCUIT JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1992-07-15 EP claimed
CN-122094772-A Method for producing laminated film, and method for separating CO2 2026-05-26 CN disclosed
CN-122094826-A Method for producing laminate and method for separating CO2 2026-05-26 CN disclosed
EP-4621487-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING CURCUMIN DERIVATIVE Nissan Chemical Corporation (JP) 2025-09-24 EP disclosed
WO-2025121031-A1 COPOLYMER 株式会社レゾナック 2025-06-12 WO disclosed
WO-2025121033-A1 METHOD FOR PRODUCING COPOLYMER 株式会社レゾナック 2025-06-12 WO disclosed
WO-2025121034-A1 RESIN COMPOSITION, MODIFIED RESIN COMPOSITION, AND METHOD FOR PRODUCING MODIFIED RESIN COMPOSITION 株式会社レゾナック 2025-06-12 WO disclosed
WO-2025120878-A1 PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE COLORING COMPOSITION, AND COLOR FILTER 株式会社レゾナック 2025-06-12 WO disclosed
US-20010041769-A1 Polysiloxane, method of manufacturing same, silicon-containingalicyclic compouns, and radiation-sensitive resin composition JSR CORPORATION (JP) 2001-11-15 US disclosed
EP-1142928-A1 Polysiloxane, method of manufacturing same, silicon-containing alicyclic compound, and radiation-sensitive resin compounds JSR Corporation (JP) 2001-10-10 EP disclosed
EP-0634696-B2 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO LTD (JP) 2001-01-31 EP disclosed
US-6114086-A COMPRISING ALKALI-SOLUBLE RESIN, DISSOLUTION CONTROLLING AGENTS, PHOTOACID GENERATOR, SOLVENT; USED FOR THE MANUFACTURE OF SEMICONDUCTOR DEVICES OR INTEGRATED CIRCUITS JSR CORPORATION (JP) 2000-09-05 US disclosed
US-5916729-A A POSITIVE TONE TYPE REISTS CONSISTS OF A RESIN WHICH HAS AN ACIDIC FUNCTIONAL GROUP PROTECTED BY AN ACID DECOMPOSABLE GROUP AND IS HYDROLYZABLE, A PHOTOACID GENERATOR AND A SOLVENT MIXTURE OF ALKYL LACTATE WITH PROPYLENE GLYCOL ETHER JSR CORPORATION (JP) 1999-06-29 US disclosed
EP-0634696-B1 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO LTD (JP) 1998-01-14 EP disclosed
US-5629135-A ALKALI-SOLUBLE RESIN, CROSSLINKER, PHOTOACID GENERATOR, SOLVENT JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1997-05-13 US disclosed
EP-0634696-A1 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1995-01-18 EP disclosed