SCHEMBL157396

SCHEMBL157396

CCC(CCC(C)OC)C(=O)O

nearest known ligand 0.52

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CA2 P00918 3/20 0.52
MAPK1 P28482 1/20 0.52
CHRM1 P11229 1/20 0.43
AKR1A1 P14550 1/20 0.43
CHRM3 P20309 1/20 0.43
HTR2A P28223 1/20 0.43
HTR2C P28335 1/20 0.43
ADRA1A P35348 1/20 0.43
HRH1 P35367 1/20 0.43
DRD3 P35462 1/20 0.43
SLC6A3 Q01959 1/20 0.43
HDAC1 Q13547 1/20 0.43
HDAC2 Q92769 1/20 0.43
TDP1 Q9NUW8 1/20 0.43
SLC1A1 P43005 6/20 0.41
SLC1A2 P43004 6/20 0.41
SLC1A3 P43003 5/20 0.41
CA1 P00915 2/20 0.38
GCLC P48506 2/20 0.37
GRIK1 P39086 2/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8168639 0.82 CA2 (0.57) CA2MAPK1CHRM1AKR1A1CHRM3
SCHEMBL125406 0.82 CA2 (0.71) CA2MAPK1CHRM1AKR1A1CHRM3
SCHEMBL29045240 0.82 CHRM1 (0.37) CA2MAPK1CHRM1AKR1A1CHRM3
SCHEMBL29108049 0.82 CA2 (0.60) CA2MAPK1CA1
SCHEMBL1408565 0.82 FOLH1 (0.50) CHRM1AKR1A1CHRM3HTR2AHTR2C
SCHEMBL29019883 0.80 CA1 (0.44) CA2TDP1CA1
SCHEMBL22127579 0.79 CA2 (0.47) CA2MAPK1CHRM1AKR1A1CHRM3
SCHEMBL6617648 0.78 CA2 (0.60) CA2MAPK1CHRM1AKR1A1CHRM3
SCHEMBL584092 0.78 CA2 (0.60) CA2MAPK1CHRM1AKR1A1CHRM3
SCHEMBL6386008 0.78 GABRR1 (0.52) CHRM1AKR1A1CHRM3HTR2AHTR2C

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 315 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-4804577-B2 2011-11-02 JP claimed
US-20100085518-A1 PHOTO-SENSITIVE RESIN COMPOSITION FOR BLACK MATRIX, BLACK MATRIX PRODUCED BY THE COMPOSITION AND LIQUID CRYSTAL DISPLAY INCLUDING THE BLACK MATRIX LG CHEM, LTD. (KR) 2010-04-08 US claimed
WO-2008102990-A1 PHOTO-SENSITIVE RESIN COMPOSITION FOR BLACK MATRIX, BLACK MATRIX PRODUCED BY THE COMPOSITION AND LIQUID CRYSTAL DISPLAY INCLUDING THE BLACK MATRIX LG CHEM, LTD. (KR) 2008-08-28 WO claimed
WO-2008078953-A1 BLACK MATRIX HIGH SENSITIVE PHOTORESIST COMPOSITION FOR LIQUID CRYSTAL DISPLAY AND BLACK MATRIX PREPARED BY USING THE SAME LG CHEM, LTD. (KR) 2008-07-03 WO claimed
EP-0260994-B1 PROCESS FOR PRODUCING INTEGRATED CIRCUIT JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1992-07-15 EP claimed
CN-122094826-A Method for producing laminate and method for separating CO2 2026-05-26 CN disclosed
CN-122094772-A Method for producing laminated film, and method for separating CO2 2026-05-26 CN disclosed
EP-4621487-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING CURCUMIN DERIVATIVE Nissan Chemical Corporation (JP) 2025-09-24 EP disclosed
WO-2025121034-A1 RESIN COMPOSITION, MODIFIED RESIN COMPOSITION, AND METHOD FOR PRODUCING MODIFIED RESIN COMPOSITION 株式会社レゾナック 2025-06-12 WO disclosed
WO-2025120878-A1 PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE COLORING COMPOSITION, AND COLOR FILTER 株式会社レゾナック 2025-06-12 WO disclosed
WO-2025121033-A1 METHOD FOR PRODUCING COPOLYMER 株式会社レゾナック 2025-06-12 WO disclosed
WO-2025121031-A1 COPOLYMER 株式会社レゾナック 2025-06-12 WO disclosed
US-20010041769-A1 Polysiloxane, method of manufacturing same, silicon-containingalicyclic compouns, and radiation-sensitive resin composition JSR CORPORATION (JP) 2001-11-15 US disclosed
EP-1142928-A1 Polysiloxane, method of manufacturing same, silicon-containing alicyclic compound, and radiation-sensitive resin compounds JSR Corporation (JP) 2001-10-10 EP disclosed
EP-0634696-B2 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO LTD (JP) 2001-01-31 EP disclosed
US-6114086-A COMPRISING ALKALI-SOLUBLE RESIN, DISSOLUTION CONTROLLING AGENTS, PHOTOACID GENERATOR, SOLVENT; USED FOR THE MANUFACTURE OF SEMICONDUCTOR DEVICES OR INTEGRATED CIRCUITS JSR CORPORATION (JP) 2000-09-05 US disclosed
US-5916729-A A POSITIVE TONE TYPE REISTS CONSISTS OF A RESIN WHICH HAS AN ACIDIC FUNCTIONAL GROUP PROTECTED BY AN ACID DECOMPOSABLE GROUP AND IS HYDROLYZABLE, A PHOTOACID GENERATOR AND A SOLVENT MIXTURE OF ALKYL LACTATE WITH PROPYLENE GLYCOL ETHER JSR CORPORATION (JP) 1999-06-29 US disclosed
EP-0634696-B1 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO LTD (JP) 1998-01-14 EP disclosed
US-5629135-A ALKALI-SOLUBLE RESIN, CROSSLINKER, PHOTOACID GENERATOR, SOLVENT JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1997-05-13 US disclosed
EP-0634696-A1 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1995-01-18 EP disclosed