SCHEMBL16035907

SCHEMBL16035907

CO[Si](CCc1ccc(OC(C)(C)C)cc1)(OC)OC

nearest known ligand 0.42

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PPARA Q07869 3/20 0.42
TAAR1 Q96RJ0 1/20 0.40
CALM1 P0DP23 2/20 0.38
MAOB P27338 2/20 0.37
SMN1; SMN2 Q16637 1/20 0.37
SIGMAR1 Q99720 1/20 0.36
AOC3 Q16853 1/20 0.36
PPARD Q03181 1/20 0.35
F2RL1 P55085 1/20 0.35
TUBB4A P04350 1/20 0.35
TUBB P07437 1/20 0.35
TUBA3C P0DPH7 1/20 0.35
TUBA1B P68363 1/20 0.35
TUBA4A P68366 1/20 0.35
TUBB4B P68371 1/20 0.35
TUBB3 Q13509 1/20 0.35
TUBB2A Q13885 1/20 0.35
TUBB8 Q3ZCM7 1/20 0.35
TUBA3E Q6PEY2 1/20 0.35
TUBA1A Q71U36 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL21271546 0.85 PPARA (0.40) PPARATAAR1CALM1MAOBSMN1; SMN2
SCHEMBL15945052 0.84 PPARA (0.41) PPARATAAR1CALM1MAOBSMN1; SMN2
SCHEMBL3043486 0.83 PPARA (0.41) PPARATAAR1SMN1; SMN2PPARD
SCHEMBL13027474 0.83 TAAR1 (0.57) TAAR1CALM1MAOBSMN1; SMN2SIGMAR1
SCHEMBL139733 0.82 TAAR1 (0.43) TAAR1CALM1MAOBSMN1; SMN2SIGMAR1
SCHEMBL17354078 0.82 PPARA (0.34) PPARATAAR1CALM1F2RL1KDM4E
SCHEMBL13790475 0.81 PPARA (0.36) PPARATAAR1SMN1; SMN2
SCHEMBL4291669 0.80 TAAR1 (0.41) TAAR1CALM1MAOBSMN1; SMN2SIGMAR1
SCHEMBL4858558 0.79 PPARA (0.42) PPARATAAR1CALM1SMN1; SMN2PPARD
SCHEMBL10338732 0.79 PPARA (0.42) PPARATAAR1SMN1; SMN2PPARDKDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11614686-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-03-28 US disclosed
US-20190258160-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2019-08-22 US disclosed
US-9902875-B2 Composition for forming a coating type BPSG film, substrate, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-02-27 US disclosed
US-9880470-B2 Composition for forming a coating type silicon-containing film, substrate, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-01-30 US disclosed
EP-2540780-B1 Composition for forming resist underlayer film and patterning process using the same SHINETSU CHEMICAL CO (JP) 2016-07-20 EP disclosed
US-20160096978-A1 COMPOSITION FOR FORMING A COATING TYPE BPSG FILM, SUBSTRATE, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-04-07 US disclosed
US-20160096977-A1 COMPOSITION FOR FORMING A COATING TYPE SILICON-CONTAINING FILM, SUBSTRATE, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-04-07 US disclosed
US-9188866-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-17 US disclosed
US-9176382-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-03 US disclosed
US-20140273447-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed
US-20140273448-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed
CN-102112922-B Positive photosensitive composition and permanent resist ADEKA CORP 2012-12-26 CN disclosed
CN-102112922-A Positive photosensitive composition and permanent resist ADEKA CORP 2011-06-29 CN disclosed