SCHEMBL16074701

SCHEMBL16074701

CC(C)(O)CC(C)(O)CCCCO

nearest known ligand 0.36

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.36
CYP4F2 P78329 2/20 0.35
CYP4A11 Q02928 2/20 0.35
SMN1; SMN2 Q16637 1/20 0.33
LMNA P02545 2/20 0.32
HSD17B10 Q99714 1/20 0.32
MEN1 O00255 1/20 0.32
KMT2A Q03164 1/20 0.32
TSHR P16473 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16074820 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074837 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074857 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074798 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074812 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074827 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074891 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074791 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074894 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA
SCHEMBL16074828 0.98 CYP4F2 (0.38) ALDH1A1CYP4F2CYP4A11SMN1; SMN2LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9188866-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-17 US disclosed
US-9176382-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-03 US disclosed
US-20140273447-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed
US-20140273448-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed