SCHEMBL16074891

SCHEMBL16074891

CC(C)(O)CC(C)(O)CCCCCO

nearest known ligand 0.38

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
CYP4F2 P78329 2/20 0.38
CYP4A11 Q02928 2/20 0.38
LMNA P02545 2/20 0.36
ALDH1A1 P00352 2/20 0.36
HSD17B10 Q99714 1/20 0.36
MEN1 O00255 1/20 0.36
KMT2A Q03164 1/20 0.36
TSHR P16473 1/20 0.36
SMN1; SMN2 Q16637 1/20 0.32
TDP1 Q9NUW8 1/20 0.31
FDPS P14324 8/20 0.30
GGPS1 O95749 5/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16074828 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074791 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074820 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074837 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074812 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074798 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074857 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074894 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074827 1.00 CYP4F2 (0.38) CYP4F2CYP4A11LMNAALDH1A1HSD17B10
SCHEMBL16074701 0.98 ALDH1A1 (0.36) CYP4F2CYP4A11LMNAALDH1A1HSD17B10

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9188866-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-17 US disclosed
US-9176382-B2 Composition for forming titanium-containing resist underlayer film and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-11-03 US disclosed
US-20140273448-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed
US-20140273447-A1 COMPOSITION FOR FORMING TITANIUM-CONTAINING RESIST UNDERLAYER FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-18 US disclosed