SCHEMBL1665274

SCHEMBL1665274

ClCOC1CCCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11879705 0.97 NPC1 (0.44)
SCHEMBL11878583 0.97 NPC1 (0.44)
SCHEMBL220993 0.97
SCHEMBL11611813 0.94
SCHEMBL1593968 0.87
SCHEMBL28418153 0.87
SCHEMBL29060993 0.80
SCHEMBL11609799 0.77
SCHEMBL5379120 0.75 NPC1 (0.52)
SCHEMBL9367734 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 17 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260079398-A1 PHOTORESIST COMPOSITIONS AND PATTERN FORMATION METHODS DUPONT ELECTRONIC MAT INTERNATIONAL LLC (US) 2026-03-19 US disclosed
CN-108368016-B Process for producing cyclopentyl alkyl ether compound 日本瑞翁株式会社 2023-09-26 CN disclosed
EP-3398928-B1 METHOD FOR PRODUCING CYCLOPENTYL ALKYL ETHER COMPOUND ZEON CORP (JP) 2021-01-20 EP disclosed
US-20180354880-A1 METHOD FOR PRODUCING CYCLOPENTYL ALKYL ETHER COMPOUND ZEON CORPORATION (JP) 2018-12-13 US disclosed
EP-3398928-A1 METHOD FOR PRODUCING CYCLOPENTYL ALKYL ETHER COMPOUND Zeon Corporation (JP) 2018-11-07 EP disclosed
US-7919227-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2011-04-05 US disclosed
US-7919227-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2011-04-05 US disclosed
US-7919227-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2011-04-05 US disclosed
US-20100040970-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2010-02-18 US disclosed
US-20100040970-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2010-02-18 US disclosed
US-20100040970-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2010-02-18 US disclosed
US-4859229-A HERBICIDES HOFFMANN-LA ROCHE INC. (US) 1989-08-22 US disclosed
CN-87105777-A Heterogeneous ring compound 1988-04-06 CN disclosed
US-4268681-A HERBICIDES, PLANT GROWTH REGULATORS, INSECTICIDES, MITICIDES BAYER AKTIENGESELLSCHAFT (DE) 1981-05-19 US disclosed
US-4185991-A 4,5-Dichloro-imidazole derivatives and their use as herbicides BAYER AKTIENGESELLSCHAFT (DE) 1980-01-29 US disclosed
US-4178166-A HERBICIDES, INSECTICIDES, PLANT GROWTH REGULATORS BAYER AKTIENGESELLSCHAFT (DE) 1979-12-11 US disclosed
US-4124765-A ANTITUMOR ONO PHARMACEUTICAL CO., LTD. (JP) 1978-11-07 US disclosed