SCHEMBL16683055

SCHEMBL16683055

CCC(C)c1ccc(OC(CC(C)C)OC2CCC3CCCCC3C2)c(C)c1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17175347 0.76 HPGD (0.35)
SCHEMBL17175322 0.73 ALDH1A1 (0.35)
SCHEMBL17147967 0.73 PPARA (0.36)
SCHEMBL14028976 0.72 ALDH1A1 (0.38)
SCHEMBL18473446 0.72 SLC7A5 (0.36)
SCHEMBL16081313 0.72 ALDH1A1 (0.34)
SCHEMBL17175381 0.71 PDE4B (0.35)
SCHEMBL17402202 0.70 ALDH1A1 (0.36)
SCHEMBL15279319 0.69 ALDH1A1 (0.39)
SCHEMBL16247798 0.69 ALDH1A1 (0.35)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20150293446-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION, RESIST FILM USING THE SAME, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-10-15 US disclosed
US-20150118628-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM THEREFROM, METHOD OF FORMING PATTERN, PROCESS FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2015-04-30 US disclosed