SCHEMBL17404455

SCHEMBL17404455

CCC(C)C(=O)OC1CC(C)CC(C(C)(C)C)C1

nearest known ligand 0.33

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
CHRM2 P08172 1/20 0.32
CHRM1 P11229 1/20 0.32
CHRM3 P20309 1/20 0.32
ADRA1A P35348 1/20 0.32
CHRNA4 P43681 1/20 0.32
HTR3A P46098 1/20 0.32
KCNH2 Q12809 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16787975 0.91 CHRM2 (0.35) CHRM2CHRM1CHRM3ADRA1ACHRNA4
SCHEMBL21020801 0.86 CHRM2 (0.37) CHRM2CHRM1CHRM3ADRA1ACHRNA4
SCHEMBL18253401 0.81 CHRM2 (0.35) CHRM2CHRM1CHRM3ADRA1ACHRNA4
SCHEMBL17853734 0.80 CHRM2 (0.34) CHRM2CHRM1CHRM3ADRA1ACHRNA4
SCHEMBL19245716 0.79 CHRM2 (0.33) CHRM2CHRM1CHRM3ADRA1ACHRNA4
SCHEMBL9945784 0.78 APOBEC3A (0.46) KCNH2SMN1; SMN2
SCHEMBL18253399 0.77 CHRM2 (0.34) CHRM2CHRM1CHRM3ADRA1ACHRNA4
SCHEMBL17853744 0.76 CHRM2 (0.33) CHRM2CHRM1CHRM3ADRA1ACHRNA4
SCHEMBL16273468 0.76 HMGCR (0.30)
SCHEMBL17515456 0.76 MEN1 (0.34) SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9551931-B2 Method of forming pattern, actinic-ray- or radiation-sensitive resin composition, actinic-ray- or radiation-sensitive film, process for manufacturing electronic device and electronic device FUJIFILM CORPORATION (JP) 2017-01-24 US disclosed
US-20160041465-A1 PATTERN FORMING METHOD, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-02-11 US disclosed
US-20160004157-A1 METHOD OF FORMING PATTERN, ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM, PROCESS FOR MANUFACTURING ELECTRONIC DEVICE AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-01-07 US disclosed