SCHEMBL1742798

SCHEMBL1742798

CC(C)(CN)NCCO

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17593265 0.82 ALDH1A1 (0.33)
SCHEMBL1457911 0.78
SCHEMBL7035084 0.78
SCHEMBL4782050 0.78 HTT (0.35)
SCHEMBL27774513 0.77
SCHEMBL11184471 0.76
SCHEMBL11616465 0.76 HTT (0.34)
SCHEMBL7967196 0.76
SCHEMBL25476008 0.75
SCHEMBL9733755 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 71 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12600697-B2 Compositions and methods for removal of n-methyl-2-pyrrolidone (NMP) degradation products and other foulants from NMP purification systems REFINED TECHNOLOGIES, INC. (US) 2026-04-14 US claimed
US-20240132446-A1 COMPOSITIONS AND METHODS FOR REMOVAL OF N-METHYL-2-PYRROLIDONE (NMP) DEGRADATION PRODUCTS AND OTHER FOULANTS FROM NMP PURIFICATION SYSTEMS REFINED TECHNOLOGIES, INC. 2024-04-25 US claimed
WO-2022251327-A1 COMPOSITIONS AND METHODS FOR REMOVAL OF N-METHYL-2-PYRROLIDONE (NMP) DEGRADATION PRODUCTS AND OTHER FOULANTS FROM NMP PURIFICATION SYSTEMS REFINED TECHNOLOGIES, INC. (US) 2022-12-01 WO claimed
CN-115197385-A Latent catalysts for the production of polyurethane foams 莫门蒂夫性能材料股份有限公司 2022-10-18 CN claimed
CN-102272675-A A photoresist image-forming process using double patterning 2011-12-07 CN claimed
EP-2389612-A1 A PHOTORESIST IMAGE-FORMING PROCESS USING DOUBLE PATTERNING AZ Electronic Materials USA Corp. (US) 2011-11-30 EP claimed
WO-2010084372-A1 A PHOTORESIST IMAGE-FORMING PROCESS USING DOUBLE PATTERNING AZ ELECTRONIC MATERIALS USA CORP. (US) 2010-07-29 WO claimed
US-20100183851-A1 Photoresist Image-forming Process Using Double Patterning CAO YI 2010-07-22 US claimed
WO-1995003874-A1 SOLVENT COMPOSITION FOR REMOVING ACID GASES THE DOW CHEMICAL COMPANY (US) 1995-02-09 WO claimed
US-5246619-A Condensation of monoethanolamine, n-methyl- THE DOW CHEMICAL COMPANY (US) 1993-09-21 US claimed
US-12600697-B2 Compositions and methods for removal of n-methyl-2-pyrrolidone (NMP) degradation products and other foulants from NMP purification systems REFINED TECHNOLOGIES, INC. (US) 2026-04-14 US disclosed
CN-114478987-B Polyurethane, method for producing polyurethane, conductive paste composition, conductive wiring, and method for producing conductive wiring 信越化学工业株式会社 2024-07-02 CN disclosed
CN-118234824-A Adhesive, laminate, method for producing laminate, and packaging material DIC株式会社 2024-06-21 CN disclosed
CN-118234825-A Adhesive, laminate, and packaging material DIC株式会社 2024-06-21 CN disclosed
CN-118234771-A Adhesive, laminate, and packaging material DIC株式会社 2024-06-21 CN disclosed
US-5246619-A Condensation of monoethanolamine, n-methyl- THE DOW CHEMICAL COMPANY (US) 1993-09-21 US disclosed
US-4880934-A Preparation of hydroxyalkylpiperazinones by reacting a 2,3-dihydroxy-1,4-dioxane with a hydroalkyldiamine THE DOW CHEMICAL COMPANY (US) 1989-11-14 US disclosed
US-4814443-A Preparation of hydroxyalkylpiperazinones by reacting glyoxal with hydroxyalkyldiamines THE DOW CHEMICAL COMPANY (US) 1989-03-21 US disclosed
US-4223138-A VAPORIZATION, CONDENSATION, RETARDING FLOW TO REACTION ZONE BAYER AKTIENGESELLSCHAFT (DE) 1980-09-16 US disclosed
US-4151015-A Flux for use in soldering LAKE CHEMICAL COMPANY (US) 1979-04-24 US disclosed