SCHEMBL17549985

SCHEMBL17549985

CCC(C)(C)C(=O)OCC(=O)OC1C2CC3C1OC(=O)C3(C)C2C(=O)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17549974 0.87 — —
SCHEMBL17549982 0.84 — —
SCHEMBL14363816 0.76 HMGCR (0.36) —
SCHEMBL17549983 0.76 — —
SCHEMBL18774891 0.76 HMGCR (0.32) —
SCHEMBL12667237 0.75 — —
SCHEMBL25894223 0.75 HMGCR (0.30) —
SCHEMBL2740789 0.75 — —
SCHEMBL75937 0.75 ALDH1A1 (0.32) —
SCHEMBL13580536 0.74 — —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20170285469-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN TOKYO OHKA KOGYO, CO., LTD. (JP) 2017-10-05 — — US disclosed
US-9341947-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2016-05-17 — — US disclosed
US-20160062236-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2016-03-03 — — US disclosed
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