SCHEMBL179013

SCHEMBL179013

CS(=O)(=O)OS

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4426266 0.96
SCHEMBL25600 0.67
SCHEMBL2869999 0.67
Methanesulfonic Acid Methyl Ester SCHEMBL16060132 0.67 USP2 (1.00)
Methanesulfonic Acid Methyl Ester SCHEMBL573583 0.67
SCHEMBL4445189 0.67 USP2 (0.54)
SCHEMBL2343521 0.67
Methanesulfonic Acid Methyl Ester SCHEMBL63290 0.67
SCHEMBL6025560 0.65
Dimethyl Sulfone SCHEMBL28813734 0.64

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 28 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119019232-A Preparation method of diether fluorene based on continuous flow reaction 陕西煤基特种燃料研究院有限公司 2024-11-26 CN disclosed
CN-110554569-B Resist composition and patterning method 信越化学工业株式会社 2024-01-16 CN disclosed
US-11435665-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-09-06 US disclosed
CN-112225646-B Preparation method of bisphenol TMC 万华化学集团股份有限公司 2022-07-12 CN disclosed
CN-112225646-A Preparation method of bisphenol TMC 万华化学集团股份有限公司 2021-01-15 CN disclosed
CN-111393367-A N-para-sulfonium salt substituted pyrazoline derivative, photocuring composition and preparation method 浙江扬帆新材料股份有限公司 2020-07-10 CN disclosed
CN-110554569-A Resist composition and patterning method SHINETSU CHEMICAL CO 2019-12-10 CN disclosed
CN-109790178-A novel cytotoxic agents and conjugates thereof 宝力泰锐克斯有限公司 2019-05-21 CN disclosed
CN-109073974-A The negative photosensitive composition of low-temperature curable AZ电子材料(卢森堡)有限公司 2018-12-21 CN disclosed
CN-107077070-A The manufacture method of photosensitive polymer combination, cured film, the element for possessing cured film and semiconductor devices 东丽株式会社 2017-08-18 CN disclosed
CN-101387829-A Radiation-sensitive resin composition SUMITOMO CHEMICAL CO (JP) 2009-03-18 CN disclosed
US-7371503-B2 Sulfonium salt compound, photoacid generator, and positive-tone radiation-sensitive resin composition JSR CORPORATION (JP) 2008-05-13 US disclosed
CN-101003509-A New pharmic acceptable salt of pyritinol, and preparation method HUANG ZHENHUA (CN) 2007-07-25 CN disclosed
US-7235343-B2 Photoacid generators, chemically amplified resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-06-26 US disclosed
US-20060141383-A1 Sulfonium salts, radiation- sensitive acid generators, and positive radiator-sensitive resin compositions JSR CORPORATION (JP) 2006-06-29 US disclosed
EP-1586570-A1 SULFONIUM SALTS, RADIATION-SENSITIVE ACID GENERATORS, AND POSITIVE RADIATION-SENSITIVE RESIN COMPOSITIONS JSR Corporation (JP) 2005-10-19 EP disclosed
US-20040229162-A1 Photoacid generators, chemically amplified resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-11-18 US disclosed
CN-1046711-C Unsaturated hydroxyalkyl quinoline carboxylic acids as leukotriene antagonists MERCK FROSST CANADA INC (CA) 1999-11-24 CN disclosed
US-5648196-A Water-soluble photoinitiators CORNELL RESEARCH FOUNDATION, INC. (US) 1997-07-15 US disclosed
CN-1061407-A Unsaturated hydroxyalkyl quinoline carboxylic acids as leukotriene antagonists MERCK FROSST CANADA INC (CA) 1992-05-27 CN disclosed