SCHEMBL1833932

SCHEMBL1833932

CC(C)n1c(=O)[nH]c(=O)[nH]c1=O

nearest known ligand 0.47

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
POLB P06746 2/20 0.47
ALDH1A1 P00352 3/20 0.44
KDM4E B2RXH2 2/20 0.44
MAPT P10636 2/20 0.44
HCRTR1 O43613 1/20 0.44
GAA P10253 1/20 0.44
HPGD P15428 1/20 0.37
ALOX15 P16050 1/20 0.37
ALOX12 P18054 1/20 0.37
HSD17B10 Q99714 1/20 0.37
PGR P06401 10/20 0.37
CYP3A4 P08684 1/20 0.36
CYP2B6 P20813 1/20 0.36
L3MBTL1 Q9Y468 1/20 0.34
MTOR P42345 1/20 0.33
MAOB P27338 1/20 0.32
MEN1 O00255 1/20 0.31
KMT2A Q03164 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9052845 0.79 POLB (0.35) POLBALDH1A1KDM4EMAPTHCRTR1
SCHEMBL11681796 0.78 POLB (0.47) POLBALDH1A1KDM4EMAPTHCRTR1
SCHEMBL25100645 0.74 KDM4E (0.40) POLBALDH1A1KDM4EMAPTHCRTR1
SCHEMBL19502639 0.74 POLB (0.37) POLBALDH1A1KDM4EMAPTHCRTR1
SCHEMBL27524563 0.74 CSNK2A2 (0.37) POLBALDH1A1KDM4EMAPTGAA
SCHEMBL11757540 0.72 LMNA (0.30)
SCHEMBL28350084 0.72 POLB (0.32) POLB
SCHEMBL11690765 0.69 POLB (0.33) POLB
SCHEMBL15613906 0.69 POLB (0.40) POLBALDH1A1KDM4EMAPTHCRTR1
SCHEMBL19508742 0.69 POLB (0.40) POLBALDH1A1KDM4EMAPTHCRTR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 36 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-122095316-A Composition for forming resist underlayer film 2026-05-26 CN disclosed
WO-2025095106-A1 RESIST UNDERLAYER FILM FORMATION COMPOSITION 日産化学株式会社 2025-05-08 WO disclosed
CN-114746468-B Method for producing polymer 日产化学株式会社 2024-09-13 CN disclosed
CN-117778244-A High-efficiency degradation bacterium for long residual herbicide in corn field and application thereof 河南省科学院生物研究所有限责任公司 2024-03-29 CN disclosed
US-20230103242-A1 METHOD FOR PRODUCING POLYMER NISSAN CHEMICAL CORPORATION (JP) 2023-03-30 US disclosed
US-20230029997-A1 COMPOSITION FOR FORMING RESIST UNDERLAYER FILM NISSAN CHEMICAL CORPORATION (JP) 2023-02-02 US disclosed
CN-114761876-A Composition for forming resist underlayer film 日产化学株式会社 2022-07-15 CN disclosed
CN-114746468-A Method for producing polymer 日产化学株式会社 2022-07-12 CN disclosed
WO-2021111977-A1 COMPOSITION FOR FORMING RESIST UNDERLAYER FILM 日産化学株式会社 2021-06-10 WO disclosed
WO-2021111976-A1 METHOD FOR PRODUCING POLYMER 日産化学株式会社 2021-06-10 WO disclosed
US-20100022089-A1 Method for manufacturing semiconductor device using quadruple-layer laminate NISSIAN CHEMICAL INDUSTRIES, LTD. (JP) 2010-01-28 US disclosed
US-7595144-B2 Sulfonate-containing anti-reflective coating forming composition for lithography NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2009-09-29 US disclosed
EP-2085823-A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING QUADRUPLE-LAYER LAMINATE Nissan Chemical Industries, Ltd. (JP) 2009-08-05 EP disclosed
US-20080038678-A1 Condensation Type Polymer-Containing Anti-Reflective Coating For Semiconductor NISSAN CHEMICAL INDUSTRIES LTD. (JP) 2008-02-14 US disclosed
US-20080003524-A1 Sulfonate-Containing Anti-Reflective Coating Forming Composition for Lithography NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2008-01-03 US disclosed
EP-1813987-A1 SULFONIC-ESTER-CONTAINING COMPOSITION FOR FORMATION OF ANTIREFLECTION FILM FOR LITHOGRAPHY Nissan Chemical Industries, Ltd. (JP) 2007-08-01 EP disclosed
EP-1757986-A1 ANTIREFLECTION FILM FOR SEMICONDUCTOR CONTAINING CONDENSATION TYPE POLYMER Nissan Chemical Industries, Ltd. (JP) 2007-02-28 EP disclosed
US-6759104-B2 LIQUID CRYSTALS DISPLAY; MIXTURE CONTAINING ACRYLATED ESTERS; PHOTOPOLYMERIZATION USING FREE RADICAL CATALYSTS MITSUBISHI CHEMICAL CORPORATION (JP) 2004-07-06 US disclosed
US-20030118941-A1 Photocurable composition, cured product and process for producing the same MITSUBISHI CHEMICAL CORPORATION (JP) 2003-06-26 US disclosed
EP-1275668-A1 PHOTOCURABLE COMPOSITION, CURED OBJECT, AND PROCESS FOR PRODUCING THE SAME MITSUBISHI CHEMICAL CORPORATION (JP) 2003-01-15 EP disclosed