SCHEMBL191816

SCHEMBL191816

CCCOC1CCCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9126471 0.97 NPC1 (0.52)
SCHEMBL9128911 0.97 NPC1 (0.52)
SCHEMBL6383373 0.97 NPC1 (0.52)
SCHEMBL6381815 0.97 NPC1 (0.52)
SCHEMBL9128685 0.97 NPC1 (0.52)
SCHEMBL190984 0.97 NPC1 (0.52)
SCHEMBL9129950 0.97 NPC1 (0.52)
SCHEMBL17885048 0.97 NPC1 (0.52)
Hydrochloric Acid SCHEMBL11432904 0.95 NPC1 (0.50)
SCHEMBL5210320 0.94

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 239 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12631966-B2 Method for forming photoresist patterns SAMSUNG SDI CO., LTD. (KR) 2026-05-19 US claimed
US-12590221-B2 Resist topcoat composition, and method of forming patterns using the composition SAMSUNG SDI CO., LTD. (KR) 2026-03-31 US claimed
US-12554199-B2 Resist topcoat composition, and method of forming patterns using the composition SAMSUNG SDI CO., LTD. (KR) 2026-02-17 US claimed
WO-2025066075-A1 ELECTROLYTE AND ALKALI METAL SECONDARY BATTERY CONTAINING SAME 中国科学院苏州纳米技术与纳米仿生研究所 2025-04-03 WO claimed
CN-119695283-A Electrolyte and alkali metal secondary battery containing same 中国科学院苏州纳米技术与纳米仿生研究所 2025-03-25 CN claimed
CN-117013085-A Weak solvation electrolyte and lithium-sulfur battery and lithium ion battery containing same 中国科学院苏州纳米技术与纳米仿生研究所 2023-11-07 CN claimed
US-20230026579-A1 METHOD FOR FORMING PHOTORESIST PATTERNS SAMSUNG SDI CO., LTD. (KR) 2023-01-26 US claimed
US-20230024422-A1 RESIST TOPCOAT COMPOSITION, AND METHOD OF FORMING PATTERNS USING THE COMPOSITION SAMSUNG SDI CO., LTD. (KR) 2023-01-26 US claimed
US-20230026721-A1 RESIST TOPCOAT COMPOSITION, AND METHOD OF FORMING PATTERNS USING THE COMPOSITION SAMSUNG SDI CO., LTD. (KR) 2023-01-26 US claimed
US-20230028244-A1 RESIST TOPCOAT COMPOSITION, AND METHOD OF FORMING PATTERNS USING THE COMPOSITION SAMSUNG SDI CO., LTD. (KR) 2023-01-26 US claimed
US-20230021469-A1 RESIST TOPCOAT COMPOSITION, AND METHOD OF FORMING PATTERNS USING THE COMPOSITION SAMSUNG ELECTRONICS CO., LTD. (KR) 2023-01-26 US claimed
US-11127974-B2 Method of preparing sulfide-based solid electrolyte, sulfide-based solid electrolyte prepared therefrom, and solid secondary battery including the sulfide electrolyte SAMSUNG ELECTRONICS CO., LTD. (KR) 2021-09-21 US claimed
US-20190348707-A1 METHOD OF PREPARING SULFIDE-BASED SOLID ELECTROLYTE, SULFIDE-BASED SOLID ELECTROLYTE PREPARED THEREFROM, AND SOLID SECONDARY BATTERY INCLUDING THE SULFIDE ELECTROLYTE SAMSUNG ELECTRONICS CO., LTD. (KR) 2019-11-14 US claimed
CN-1454897-A Method for producing phosphorousphenate BAYER AG (DE) 2003-11-12 CN claimed
US-12631966-B2 Method for forming photoresist patterns SAMSUNG SDI CO., LTD. (KR) 2026-05-19 US disclosed
US-12624318-B2 Cleaning agent composition and cleaning method NISSAN CHEMICAL CORPORATION (JP) 2026-05-12 US disclosed
US-12590221-B2 Resist topcoat composition, and method of forming patterns using the composition SAMSUNG SDI CO., LTD. (KR) 2026-03-31 US disclosed
WO-1998007720-A1 SUBSTITUTED 2-ARYLPYRIDINE AS HERBICIDE BASF AKTIENGESELLSCHAFT (DE) 1998-02-26 WO disclosed
WO-1998005649-A1 SUBSTITUTED 3-PHENYL PYRAZOLES BASF AKTIENGESELLSCHAFT (DE) 1998-02-12 WO disclosed
US-3971825-A (5,6) (10,11) BIS-METHYLENE, BRONCHODILATORS SANKYO COMPANY LIMITED (JA) 1976-07-27 US disclosed