SCHEMBL196786

SCHEMBL196786

CCOC(C)Oc1ccc(Cc2ccc(OC(C)OCC)cc2)cc1

nearest known ligand 0.44

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
LTA4H P09960 3/20 0.44
LMNA P02545 1/20 0.42
POLB P06746 1/20 0.38
PPARG P37231 3/20 0.38
PPARA Q07869 3/20 0.38
ADRA2A P08913 1/20 0.36
GPR65 Q8IYL9 1/20 0.36
ALDH1A1 P00352 1/20 0.36
KDM4A O75164 1/20 0.36
MAPT P10636 1/20 0.36
KDM4C Q9H3R0 1/20 0.36
MAPK1 P28482 1/20 0.36
ELANE P08246 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13717180 0.91 ESR1 (0.47) LTA4HPOLBPPARAKDM4AMAPT
SCHEMBL3852488 0.89 LMNA (0.52) LTA4HLMNAPOLBPPARA
SCHEMBL5701335 0.88 PPARA (0.42) LMNAPOLBPPARGPPARAALDH1A1
SCHEMBL2772836 0.85 PPARG (0.43) LTA4HLMNAPOLBPPARGPPARA
SCHEMBL14086002 0.85 PPARA (0.40) LMNAPPARGPPARA
SCHEMBL24804119 0.85 PPARA (0.41) LTA4HLMNAPOLBPPARGPPARA
SCHEMBL12907821 0.85 LMNA (0.39) LTA4HLMNAPOLBPPARGPPARA
SCHEMBL4059616 0.83 LMNA (0.46) LMNAPPARGPPARAMAPT
SCHEMBL18760681 0.82 HRH3 (0.45) LMNAPOLBALDH1A1
SCHEMBL9875562 0.82 CYP4F2 (0.44) LMNAPOLBPPARGPPARA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 225 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1308782-B1 Chemically amplified positive resist composition and patterning process SHINETSU CHEMICAL CO (JP) 2012-09-05 EP claimed
US-6660447-B2 Copolymers of fluorinated vinyl phenol units and acrylonitrile units has high transmittance to VUV radiation SHIN-ETSU CHEMICAL CO., LTD. (JP) 2003-12-09 US claimed
CN-105301905-B Chemically amplified positive resist composition and patterning method 信越化学工业株式会社 2020-11-20 CN disclosed
EP-2955576-B1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHINETSU CHEMICAL CO (JP) 2020-07-22 EP disclosed
US-9519217-B2 Chemically amplified positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-12-13 US disclosed
EP-2955576-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2015-12-16 EP disclosed
US-20150355543-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-12-10 US disclosed
EP-2105794-B1 Novel photoacid generator, resist composition, and patterning process SHINETSU CHEMICAL CO (JP) 2015-08-19 EP disclosed
EP-2033966-B1 Novel photoacid generators, resist compositons, and patterning processes SHINETSU CHEMICAL CO (JP) 2015-07-29 EP disclosed
US-8980525-B2 Chemically amplified positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-17 US disclosed
US-8968982-B2 Chemically amplified positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-03 US disclosed
US-20010033994-A1 Chemical amplification, positive resist compositions SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-10-25 US disclosed
US-20010033989-A1 Novel polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-10-25 US disclosed
US-20010031421-A1 Chemical amplification resist compositions SHIN-ETSU CHEMICAL CO., LTD. OF (JP) 2001-10-18 US disclosed
US-20010018162-A1 Novel polymers, chemical amplification resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-08-30 US disclosed
EP-1126322-A2 Fluorine-containing polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-08-22 EP disclosed
US-20010010890-A1 Polymers, chemical amplification resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-08-02 US disclosed
EP-1117003-A1 Chemical amplification type resist composition Shin-Etsu Chemical Co., Ltd. (JP) 2001-07-18 EP disclosed
US-20010003772-A1 Polymer, resist composition and patterning process SHIN-ETSU CHEMICDL CO., LTD. OF (JP) 2001-06-14 US disclosed
EP-1077391-A1 Onium salts, photoacid generators for resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-02-21 EP disclosed