SCHEMBL19680384

SCHEMBL19680384

CCCC(c1cc(C(C)(C)C)c(O)c(COC)c1C)c1cc(C(C)(C)C)c(O)c(COC)c1C

nearest known ligand 0.52

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CYP2C9 P11712 5/20 0.52
CYP2C19 P33261 5/20 0.52
TP53 P04637 2/20 0.52
CYP2D6 P10635 1/20 0.52
ALOX15 P16050 1/20 0.52
SMN1; SMN2 Q16637 3/20 0.39
HIF1A Q16665 2/20 0.39
CA2 P00918 3/20 0.35
CA1 P00915 2/20 0.35
CYP1A2 P05177 2/20 0.35
CYP3A4 P08684 1/20 0.35
TSHR P16473 1/20 0.35
ALDH1A1 P00352 2/20 0.34
POLB P06746 1/20 0.34
TYR P14679 1/20 0.34
HSPA5 P11021 2/20 0.33
PTGS1 P23219 2/20 0.32
PTGS2 P35354 1/20 0.32
HMGCR P04035 1/20 0.32
GLRA3 O75311 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2017743 0.81 CYP2C9 (0.62) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL5013719 0.79 CYP2C9 (0.59) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL2017741 0.78 CYP2C9 (0.62) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL8655042 0.78 CYP2C19 (0.49) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL20602843 0.77 CYP2C9 (0.56) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL8922674 0.75 CYP2C9 (0.57) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL14432017 0.73 CYP2C9 (0.52) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL70420 0.72 CYP2C9 (0.58) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL16440138 0.71 CYP2C9 (0.41) CYP2C9CYP2C19TP53CYP2D6ALOX15
SCHEMBL28301369 0.70 CYP2C19 (0.49) CYP2C9CYP2C19TP53CYP2D6SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10928727-B2 Actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, mask blank including actinic ray-sensitive or radiation-sensitive film, pattern forming method, and method for manufacturing FUJIFILM CORPORATION (JP) 2021-02-23 US disclosed
US-10545405-B2 Actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, mask blank including actinic ray-sensitive or radiation-sensitive film, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2020-01-28 US disclosed
US-20180120701-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2018-05-03 US disclosed
US-20180120701-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2018-05-03 US disclosed
US-20180087010-A1 PRE-RINSING LIQUID, PRE-RINSING TREATMENT METHOD, AND PATTERN FORMING METHOD FUJIFILM CORPORATION (JP) 2018-03-29 US disclosed
US-20180087010-A1 PRE-RINSING LIQUID, PRE-RINSING TREATMENT METHOD, AND PATTERN FORMING METHOD FUJIFILM CORPORATION (JP) 2018-03-29 US disclosed
US-20170351176-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-12-07 US disclosed
US-20170351176-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-12-07 US disclosed