SCHEMBL19846343

SCHEMBL19846343

O=C(OCC(F)(F)S(=O)(=O)O)C1CC(C(=O)Oc2c(I)cc(I)cc2I)CC(C(=O)Oc2c(I)cc(I)cc2I)C1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19846257 0.81 — —
SCHEMBL19846338 0.81 — —
SCHEMBL25476593 0.78 — —
SCHEMBL19846328 0.78 LMNA (0.30) —
SCHEMBL19846371 0.77 — —
SCHEMBL19852633 0.77 — —
SCHEMBL19846314 0.77 — —
SCHEMBL19846325 0.77 — —
SCHEMBL19846333 0.77 — —
SCHEMBL19846344 0.77 NPSR1 (0.31) —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230273519-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMATION METHOD JSR CORPORATION (JP) 2023-08-31 — — US disclosed
US-20180039173-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-02-08 — — US disclosed
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