Charcoal, Activated

Charcoal, Activated

SCHEMBL2004690

[C].[Hf].[O]

nearest known ligand 0.00

Full drug profile on Sugi Atlas →

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-114481230-B High-density hafnium carbon oxygen solid solution, preparation method thereof and method for preparing metal hafnium by electrolysis 北京科技大学 2023-05-09 CN claimed
CN-114481230-A High-density hafnium-carbon-oxygen solid solution, preparation method thereof and method for preparing metal hafnium through electrolysis 北京科技大学 2022-05-13 CN claimed
CN-114481230-B High-density hafnium carbon oxygen solid solution, preparation method thereof and method for preparing metal hafnium by electrolysis 北京科技大学 2023-05-09 CN disclosed
CN-114481230-B High-density hafnium carbon oxygen solid solution, preparation method thereof and method for preparing metal hafnium by electrolysis 北京科技大学 2023-05-09 CN disclosed
CN-114481230-A High-density hafnium-carbon-oxygen solid solution, preparation method thereof and method for preparing metal hafnium through electrolysis 北京科技大学 2022-05-13 CN disclosed
CN-114481230-A High-density hafnium-carbon-oxygen solid solution, preparation method thereof and method for preparing metal hafnium through electrolysis 北京科技大学 2022-05-13 CN disclosed
CN-114481230-A High-density hafnium-carbon-oxygen solid solution, preparation method thereof and method for preparing metal hafnium through electrolysis 北京科技大学 2022-05-13 CN disclosed
US-7964515-B2 Method of forming high-dielectric constant films for semiconductor devices TOKYO ELECTRON LIMITED (JP) 2011-06-21 US disclosed
US-20090163012-A1 METHOD OF FORMING HIGH-DIELECTRIC CONSTANT FILMS FOR SEMICONDUCTOR DEVICES TOKYO ELECTRON LIMITED (JP) 2009-06-25 US disclosed