Predicted protein targets (top 5)
| gene | UniProt | supporting neighbours | confidence | |
|---|---|---|---|---|
| ▸ | TSHR | P16473 | 2/20 | 0.35 |
| ▸ | ALDH1A1 | P00352 | 1/20 | 0.35 |
| ▸ | ZDHHC20 | Q5W0Z9 | 1/20 | 0.32 |
| ▸ | ZDHHC2 | Q9UIJ5 | 1/20 | 0.32 |
| ▸ | FAAH | O00519 | 1/20 | 0.31 |
Click a target to see other patent compounds predicted against it — the reverse direction, in place.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL2101223 | 0.85 | — | — | |
| SCHEMBL2101663 | 0.79 | TSHR (0.33) | TSHRALDH1A1ZDHHC20ZDHHC2 | |
| SCHEMBL2271060 | 0.76 | TSHR (0.35) | TSHRALDH1A1ZDHHC20ZDHHC2FAAH | |
| SCHEMBL2104547 | 0.74 | — | — | |
| SCHEMBL2101105 | 0.73 | TSHR (0.32) | TSHRALDH1A1ZDHHC20ZDHHC2 | |
| SCHEMBL10592874 | 0.71 | TSHR (0.31) | TSHRALDH1A1 | |
| SCHEMBL2275019 | 0.71 | ALDH1A1 (0.31) | TSHRALDH1A1 | |
| SCHEMBL29156496 | 0.71 | TSHR (0.43) | TSHRALDH1A1ZDHHC20ZDHHC2FAAH | |
| SCHEMBL2272463 | 0.70 | ALDH1A1 (0.30) | TSHRALDH1A1 | |
| SCHEMBL1474752 | 0.69 | TSHR (0.41) | TSHRALDH1A1ZDHHC20ZDHHC2FAAH |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-8404584-B2 | Method of manufacturing semiconductor device | FUJITSU LIMITED (JP) | 2013-03-26 | — | — | US | disclosed |
| US-8164166-B2 | Interfacial roughness reducing film, wiring layer, semiconductor device, and method of manufacturing semiconductor device | FUJITSU LIMITED (JP) | 2012-04-24 | — | — | US | disclosed |
| US-20110207319-A1 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | FUJITSU LIMITED (JP) | 2011-08-25 | — | — | US | disclosed |
| US-20090085170-A1 | INTERFACIAL ROUGHNESS REDUCING FILM, WIRING LAYER, SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | FUJITSU LIMITED (JP) | 2009-04-02 | — | — | US | disclosed |