SCHEMBL2121685

SCHEMBL2121685

C=C(C)C(=O)OCC(C)C1CC2CCC1C2

nearest known ligand 0.47

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.47
HPGD P15428 3/20 0.43
LMNA P02545 1/20 0.43
SMN1; SMN2 Q16637 1/20 0.43
ALDH1A1 P00352 5/20 0.41
POLB P06746 2/20 0.35
KMT2A Q03164 2/20 0.34
NPC1 O15118 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2118981 0.78 TSHR (0.45) TSHRLMNAALDH1A1KMT2A
SCHEMBL11296271 0.78 HPGD (0.42) HPGDLMNASMN1; SMN2ALDH1A1POLB
SCHEMBL2119096 0.78 TSHR (0.51) TSHRALDH1A1
SCHEMBL3410115 0.77 HPGD (0.43) HPGDLMNASMN1; SMN2ALDH1A1POLB
SCHEMBL32688530 0.75 HPGD (0.51) HPGDLMNASMN1; SMN2ALDH1A1POLB
SCHEMBL9081564 0.75 TSHR (0.60) TSHRALDH1A1
SCHEMBL27820116 0.75 HPGD (0.39) HPGDLMNASMN1; SMN2ALDH1A1POLB
SCHEMBL11294328 0.74 ALDH1A1 (0.38) HPGDLMNASMN1; SMN2ALDH1A1POLB
SCHEMBL11603244 0.73 HPGD (0.53) HPGDLMNASMN1; SMN2ALDH1A1POLB
SCHEMBL1316621 0.73 ALDH1A1 (0.47) TSHRHPGDLMNAALDH1A1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9598520-B2 Radiation-sensitive resin composition, polymer and method for forming a resist pattern JSR CORPORATION (JP) 2017-03-21 US disclosed
EP-2503392-B1 RADIATION-SENSITIVE RESIN COMPOSITION, POLYMER AND RESIST PATTERN FORMATION METHOD JSR CORP (JP) 2015-04-15 EP disclosed
US-8815490-B2 Radiation-sensitive resin composition, polymer, and method for forming resist pattern JSR CORPORATION (JP) 2014-08-26 US disclosed
US-20120295197-A1 RADIATION-SENSITIVE RESIN COMPOSITION, POLYMER AND METHOD FOR FORMING A RESIST PATTERN JSR CORPORATION (JP) 2012-11-22 US disclosed
EP-2503392-A1 RADIATION-SENSITIVE RESIN COMPOSITION, POLYMER AND RESIST PATTERN FORMATION METHOD JSR Corporation (JP) 2012-09-26 EP disclosed
US-20120094234-A1 RADIATION-SENSITIVE RESIN COMPOSITION, POLYMER, AND METHOD FOR FORMING RESIST PATTERN JSR CORPORATION (JP) 2012-04-19 US disclosed
EP-0011481-B1 RUPTURABLE CONTAINERS FOR FLUIDS SUCH AS PHOTOGRAPHIC PROCESSING FLUIDS AND PHOTOGRAPHIC FILM UNITS INCLUDING SUCH CONTAINERS OF PROCESSING FLUIDS EASTMAN KODAK COMPANY (a New Jersey corporation) (US) 1982-11-03 EP disclosed
EP-0011481-A1 Rupturable containers for fluids such as photographic processing fluids and photographic film units including such containers of processing fluids EASTMAN KODAK COMPANY (a New Jersey corporation) (US) 1980-05-28 EP disclosed
US-4188219-A ACRYLIC ESTER-ACRYLIC NORBRONYL ESTER COPOLYMERS, PHOTOGRAPHIC FILMS EASTMAN KODAK COMPANY (US) 1980-02-12 US disclosed