SCHEMBL2149222

SCHEMBL2149222

COC(O[Zr](OC(OC)C(C)C)(OC(OC)C(C)C)OC(OC)C(C)C)C(C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1295491 0.79
SCHEMBL133571 0.78
SCHEMBL17245048 0.67
SCHEMBL28699607 0.67
SCHEMBL17468497 0.65
SCHEMBL3890486 0.65
SCHEMBL3887960 0.65
SCHEMBL3993263 0.65
SCHEMBL1296617 0.65
SCHEMBL3987695 0.65

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 37 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250113489-A1 GERMANIUM-DOPED CHARGE TRAPPING LAYER, RELATED DEVICES, RELATED SYSTEMS, AND RELATED METHODS ASM IP HOLDING B.V. (NL) 2025-04-03 US claimed
EP-1698614-B1 METAL COMPOUND, MATERIAL FOR FORMING THIN FILM AND METHOD FOR PREPARING THIN FILM ADEKA CORP (JP) 2011-07-13 EP claimed
US-20070122947-A1 Metal compound, material for thin film formation, and process of forming thin film ADEKA CORPORATION (JP) 2007-05-31 US claimed
EP-1698614-A1 METAL COMPOUND, MATERIAL FOR FORMING THIN FILM AND METHOD FOR PREPARING THIN FILM Asahi Denka Co., Ltd. (JP) 2006-09-06 EP claimed
US-20260005017-A1 METHODS FOR FORMING A DOPED HIGH-K LAYER ON A SUBSTRATE ASM IP HOLDING BV (NL) 2026-01-01 US disclosed
US-20250289790-A1 UV LIGHT STABILIZERS BASF SE (DE) 2025-09-18 US disclosed
US-20250273458-A1 METHODS FOR FORMING SEMICONDUCTOR STRUCTURES COMPRISING HAFNIUM ZIRCONIUM OXIDE LAYERS AND METAL OXIDE LAYERS, AND ASSOCIATED STRUCTURES, AND SYSTEMS ASM IP HOLDING B.V. (NL) 2025-08-28 US disclosed
US-20250171407-A1 ULTRAVIOLET ABSORBER BASF SE (DE) 2025-05-29 US disclosed
US-20250113489-A1 GERMANIUM-DOPED CHARGE TRAPPING LAYER, RELATED DEVICES, RELATED SYSTEMS, AND RELATED METHODS ASM IP HOLDING B.V. (NL) 2025-04-03 US disclosed
US-20250101579-A1 METHODS FOR FORMING A DOPED HAFNIUM ZIRCONIUM OXIDE LAYER ON A SUBSTRATE ASM IP HOLDING B.V. (NL) 2025-03-27 US disclosed
EP-4519249-A1 UV LIGHT STABILIZERS BASF SE (DE) 2025-03-12 EP disclosed
EP-4482827-A1 ULTRAVIOLET ABSORBER BASF SE (DE) 2025-01-01 EP disclosed
EP-2620455-A1 METHOD FOR PRODUCING TERMINAL ACRYLIC-MODIFIED POLYBUTADIENE OR TERMINAL ACRYLIC-MODIFIED HYDROGENATED POLYBUTADIENE, AND COMPOSITION CONTAINING SAME Nippon Soda Co., Ltd. (JP) 2013-07-31 EP disclosed
US-20130165586-A1 METHOD FOR PRODUCING TERMINAL ACRYLIC-MODIFIED POLYBUTADIENE OR TERMINAL ACRYLIC-MODIFIED HYDROGENATED POLYBUTADIENE, AND COMPOSITION CONTAINING SAME NIPPON SODA CO., LTD. (JP) 2013-06-27 US disclosed
US-20120276721-A1 METHOD OF FORMING AN OXIDE LAYER AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING THE OXIDE LAYER SAMSUNG ELECTRONICS CO., LTD. (KR) 2012-11-01 US disclosed
EP-1698614-B1 METAL COMPOUND, MATERIAL FOR FORMING THIN FILM AND METHOD FOR PREPARING THIN FILM ADEKA CORP (JP) 2011-07-13 EP disclosed
US-20100028536-A1 METAL COMPOUND, MATERIAL FOR THIN FILM FORMATION, AND PROCESS OF FORMING THIN FILM ADEKA CORPORATION (JP) 2010-02-04 US disclosed
US-20070122947-A1 Metal compound, material for thin film formation, and process of forming thin film ADEKA CORPORATION (JP) 2007-05-31 US disclosed
US-20060240677-A1 Method for manufacturing semiconductor device and substrate processing apparatus HITACHI KOKUSAI ELECTRIC INC., (JP) 2006-10-26 US disclosed
EP-1698614-A1 METAL COMPOUND, MATERIAL FOR FORMING THIN FILM AND METHOD FOR PREPARING THIN FILM Asahi Denka Co., Ltd. (JP) 2006-09-06 EP disclosed