Dimethylamine

Dimethylamine

SCHEMBL21980951

CNC.[GeH4]

nearest known ligand 0.00

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⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Dimethylamine SCHEMBL1330452 0.89
Dimethylamine SCHEMBL5164633 0.89
Dimethylamine SCHEMBL12415750 0.89
Dimethylamine SCHEMBL392668 0.89
Dimethylamine SCHEMBL1030 0.89
Dimethylamine SCHEMBL13695986 0.89
Dimethylamine SCHEMBL11567323 0.80
Dimethylamine SCHEMBL8065154 0.80 KDM4E (0.38)
Dimethylamine SCHEMBL1003093 0.80 KDM4E (0.38)
Dimethylamine SCHEMBL7601721 0.80

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-107342218-A The electric charge capture layer formed by ald ASM IP控股有限公司 2017-11-10 CN claimed
US-12051586-B2 Method of manufacturing semiconductor device SAMSUNG ELECTRONICS CO., LTD. (KR) 2024-07-30 US disclosed
US-11114297-B2 Method for forming semiconductor film and film forming device TOKYO ELECTRON LIMITED (JP) 2021-09-07 US disclosed
US-20210175073-A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE SAMSUNG ELECTRONICS CO., LTD. (KR) 2021-06-10 US disclosed
CN-111696851-A Film forming method and heat treatment apparatus 东京毅力科创株式会社 2020-09-22 CN disclosed
US-20200168455-A1 Method for Forming Semiconductor Film and Film Forming Device TOKYO ELECTRON LIMITED (JP) 2020-05-28 US disclosed
CN-108604620-A Multi-junction optoelectronic device with group IV semiconductor as bottom junction 奥塔装置公司 2018-09-28 CN disclosed
CN-103305805-B Wearing part with coating depletion region and the method for producing the wearing part 波音公司 2018-06-26 CN disclosed
CN-107923893-A Carbon analysis method 东亚合成株式会社 2018-04-17 CN disclosed
CN-106068335-A Germanium or the ald of germanium oxide 皮考逊公司 2016-11-02 CN disclosed
CN-100513636-C Organometallic compounds ROMA AND HAAS ELECTRONIC MATER (US) 2009-07-15 CN disclosed