SCHEMBL2434549

SCHEMBL2434549

CCCCOC(=O)C(C)OC(=O)C(C)=O

nearest known ligand 0.50

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 3/20 0.50
ATM Q13315 1/20 0.42
TSHR P16473 4/20 0.42
HPGD P15428 2/20 0.40
HCAR2 Q8TDS4 1/20 0.38
NAAA Q02083 1/20 0.37
L3MBTL1 Q9Y468 2/20 0.37
TDP1 Q9NUW8 1/20 0.37
NPC1 O15118 1/20 0.36
RAB9A P51151 1/20 0.36
SMN1; SMN2 Q16637 1/20 0.36
NPSR1 Q6W5P4 2/20 0.36
MAPT P10636 1/20 0.36
FAAH O00519 1/20 0.36
LMNA P02545 2/20 0.35
EPHX1 P07099 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1656042 0.86 TSHR (0.56) ALDH1A1ATMTSHRHPGDHCAR2
SCHEMBL18915848 0.85 ALDH1A1 (0.59) ALDH1A1ATMTSHRHPGDHCAR2
SCHEMBL17028805 0.85 ALDH1A1 (0.59) ALDH1A1ATMTSHRHPGDHCAR2
SCHEMBL12150098 0.82 ALDH1A1 (0.50) ALDH1A1ATMTSHRHPGDHCAR2
SCHEMBL13572188 0.81 TSHR (0.64) ALDH1A1TSHRHPGDHCAR2NAAA
SCHEMBL1639253 0.80 ALDH1A1 (0.42) ALDH1A1TSHRHPGDL3MBTL1NPSR1
SCHEMBL1639255 0.80 ALDH1A1 (0.42) ALDH1A1TSHRHPGDL3MBTL1NPSR1
SCHEMBL10704587 0.79 ALDH1A1 (0.47) ALDH1A1ATMTSHRHPGDHCAR2
SCHEMBL8391017 0.79 ALDH1A1 (0.47) ALDH1A1ATMTSHRHPGDHCAR2
SCHEMBL9395280 0.79 ALDH1A1 (0.47) ALDH1A1ATMTSHRHPGDHCAR2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 67 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2450412-B1 Silicone coating composition MERCK PATENT GMBH (DE) 2019-08-28 EP disclosed
EP-2102156-B1 PHOTOACTIVE COMPOUNDS MERCK PATENT GMBH (DE) 2019-06-26 EP disclosed
EP-2121857-B1 SILICONE COATING COMPOSITION AZ ELECTRONIC MATERIALS USA (US) 2014-06-04 EP disclosed
US-8252503-B2 Photoresist compositions AZ ELECTRONIC MATERIALS USA CORP. (US) 2012-08-28 US disclosed
EP-2122418-B1 STRIPPER FOR COATING LAYER AZ ELECTRONIC MATERIALS USA (US) 2012-08-08 EP disclosed
US-8211621-B2 Antireflective coating compositions AZ ELECTRONIC MATERIALS USA CORP. (US) 2012-07-03 US disclosed
EP-2450412-A1 Silicone coating composition AZ Electronic Materials USA Corp. (US) 2012-05-09 EP disclosed
EP-2370859-A2 A PHOTOSENSITIVE COMPOSITION AZ Electronic Materials USA Corp. (US) 2011-10-05 EP disclosed
US-8026040-B2 High silicon-content resin composition used to form thin film thermosets; form low k dielectric constant materials; hard mask and underlayer materials with anti-reflective properties for photolithography industry AZ ELECTRONIC MATERIALS USA CORP. (US) 2011-09-27 US disclosed
US-8026201-B2 Comprising: a fluoride source, an organic quaternary ammonium base, and a solvent selected from an organic solvent, water, and mixtures thereof; for removing silicon-based anti-reflective coatings/hardmask layers from microelectronics; etch selectivity AZ ELECTRONIC MATERIALS USA CORP. (US) 2011-09-27 US disclosed
US-20080014529-A1 ANTIREFLECTIVE COATING COMPOSITIONS AZ ELECTRONIC MATERIALS USA CORP. 2008-01-17 US disclosed
US-20080008954-A1 HIGH SILICON-CONTENT THIN FILM THERMOSETS AZ ELECTRONIC MATERIALS USA CORP. 2008-01-10 US disclosed
WO-2007148221-A1 HIGH SILICON-CONTENT THIN FILM THERMOSETS AZ ELECTRONIC MATERIALS USA CORP. (DE) 2007-12-27 WO disclosed
US-20070248913-A1 PROCESS FOR PRODUCING FILM FORMING RESINS FOR PHOTORESIST COMPOSITIONS AZ ELECTRONIC MATERIALS USA CORP. 2007-10-25 US disclosed
WO-2007057773-A2 PHOTOACTIVE COMPOUNDS AZ ELECTRONIC MATERIALS USA CORP. (DE) 2007-05-24 WO disclosed
US-20070111138-A1 Photoactive compounds MERCK PATENT GMBH (DE) 2007-05-17 US disclosed
WO-2007007175-A2 PHOTOACTIVE COMPOUNDS AZ ELECTRONIC MATERIAL USA CORP. (DE) 2007-01-18 WO disclosed
US-20070015084-A1 Iodonium or sulfonium di-(tetrafluoroethyl sulfonate) ether acid generators; imaging negative and positive patterns in semiconductors and photoresists; microlithography; high photosensitivity MERCK PATENT GMBH (DE) 2007-01-18 US disclosed
US-20060131240-A1 Process for treating solvents AZ ELECTRONIC MATERIALS USA CORP. 2006-06-22 US disclosed
WO-2006064368-A2 PROCESS FOR TREATING SOLVENTS AZ ELECTRONIC MATERIALS USA CORP. (DE) 2006-06-22 WO disclosed