⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL9979376 | 0.68 | — | — | |
| SCHEMBL5797193 | 0.66 | — | — | |
| SCHEMBL29640853 | 0.66 | — | — | |
| SCHEMBL5499984 | 0.66 | — | — | |
| SCHEMBL434615 | 0.62 | — | — | |
| SCHEMBL725791 | 0.62 | ALDH1A1 (0.33) | — | |
| SCHEMBL10391344 | 0.62 | — | — | |
| SCHEMBL2506518 | 0.62 | — | — | |
| SCHEMBL5493323 | 0.62 | — | — | |
| SCHEMBL1026655 | 0.62 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 35 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| JP-4646076-B2 | — | — | 2011-03-09 | — | — | JP | claimed |
| EP-1704408-B1 | USE OF SILOXANE-BASED POLYMERS OR COMPOSITES IN CHEMICAL SENSORS FOR DETECTING NITRATE COMPOUNDS | COMMISSARIAT ENERGIE ATOMIQUE (FR) | 2010-10-20 | — | — | EP | claimed |
| US-7749767-B2 | Use of siloxane-based polymers or composites in chemical sensor for detecting nitrate compounds | COMMISSARIAT A L'ENERGIE ATOMIQUE (FR) | 2010-07-06 | — | — | US | claimed |
| US-20070178600-A1 | Use of siloxane-based polymers or composites in chemical sensor for detecting nitrate compounds | COMMISSARIAT A L'ENERGIE ATOMIQUE (FR) | 2007-08-02 | — | — | US | claimed |
| EP-1704408-A1 | USE OF SILOXANE-BASED POLYMERS OR COMPOSITES IN CHEMICAL SENSORS FOR DETECTING NITRATE COMPOUNDS | Commissariat A L'Energie Atomique (FR) | 2006-09-27 | — | — | EP | claimed |
| WO-2005057198-A1 | USE OF SILOXANE-BASED POLYMERS OR COMPOSITES IN CHEMICAL SENSORS FOR DETECTING NITRATE COMPOUNDS | COMMISSARIAT A L'ENERGIE ATOMIQUE (FR) | 2005-06-23 | — | — | WO | claimed |
| US-6302523-B1 | CHANNELS TERMINATE IN NOZZLES ON ONE SURFACE OF THE PRINTHEAD, SAID SURFACE HAVING COVALENTLY BONDED THERETO A COATING OF AN ORGANOSILOXANE POLYMER | XEROX CORPORATION | 2001-10-16 | — | — | US | claimed |
| EP-0667029-B1 | THIXOTROPIC MAGNETORHEOLOGICAL MATERIALS | LORD CORP (US) | 1998-09-23 | — | — | EP | claimed |
| US-5645752-A | Thixotropic magnetorheological materials | LORD CORPORATION (US) | 1997-07-08 | — | — | US | claimed |
| US-12391830-B2 | Liquids for tunable optical devices | OPTOTUNE AG (CH) | 2025-08-19 | — | — | US | disclosed |
| US-20250090820-A1 | LOCALIZED DRUG DELIVERY TO PREVENT VASCULAR RESTENOSIS | OHIO STATE INNOVATION FOUNDATION | 2025-03-20 | — | — | US | disclosed |
| US-20250090466-A1 | DRUG DELIVERY COMPOSITIONS AND DEVICES | OHIO STATE INNOVATION FOUNDATION | 2025-03-20 | — | — | US | disclosed |
| WO-2024184497-A1 | SHEAR THINNING TWO-PHASE COMPOSITION AND PRODUCTS MADE THEREOF | EMPA EIDGENÖSSISCHE MATERIALPRÜFUNGS- UND FORSCHUNGSANSTALT (CH) | 2024-09-12 | — | — | WO | disclosed |
| EP-4428196-A1 | SHEAR THINNING TWO-PHASE COMPOSITION AND PRODUCTS MADE THEREOF | EMPA Eidgenössische Materialprüfungs- und Forschungsanstalt (CH) | 2024-09-11 | — | — | EP | disclosed |
| EP-0667029-A1 | THIXOTROPIC MAGNETORHEOLOGICAL MATERIALS | LORD CORPORATION (US) | 1995-08-16 | — | — | EP | disclosed |
| EP-0667029-A4 | THIXOTROPIC MAGNETORHEOLOGICAL MATERIALS. | LORD CORP (US) | 1995-06-13 | — | — | EP | disclosed |
| US-5330836-A | Couplers | TEMPLE UNIVERSITY-OF THE COMMON COMMONWEALTH SYSTEM OF HIGHER EDUCATION (US) | 1994-07-19 | — | — | US | disclosed |
| WO-1994010693-A1 | THIXOTROPIC MAGNETORHEOLOGICAL MATERIALS | LORD CORPORATION (US) | 1994-05-11 | — | — | WO | disclosed |
| WO-1994005730-A1 | FUNCTIONALIZED SILICA PARTICLE AND USE THEREOF FOR CROSS-LINKING SILICONES | TEMPLE UNIVERSITY - OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION (US) | 1994-03-17 | — | — | WO | disclosed |
| US-4983545-A | Planarization of dielectric films on integrated circuits | NEC CORPORATION (JP) | 1991-01-08 | — | — | US | disclosed |