SCHEMBL272918

SCHEMBL272918

CC1(CCCN)CC[Si](C)(CCCN)[Si](C)(C)O1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7513633 0.79
SCHEMBL21641959 0.78
SCHEMBL5493393 0.77
SCHEMBL29170565 0.77
SCHEMBL29170578 0.77
SCHEMBL21641952 0.77
SCHEMBL2030791 0.71
SCHEMBL19064352 0.68
SCHEMBL4280949 0.68
SCHEMBL27980324 0.68

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 43 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7018776-B2 Stable non-photosensitive polyimide precursor compositions for use in bilayer imaging systems ARCH SPECIALTY CHEMICALS, INC. (US) 2006-03-28 US claimed
US-20040161711-A1 Stable non-photosensitive polyimide precursor compositions for use in bilayer imaging systems ARCH SPECIALTY CHEMICALS, INC. 2004-08-19 US claimed
JP-5140306-A None JP disclosed
JP-5311072-A None JP disclosed
US-9519216-B2 Positive photosensitive resin compositions FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2016-12-13 US disclosed
US-8530003-B2 Polybenzoxazole precursor, photosensitive resin composition using the same, and manufacturing method of semiconductor device FUJIFILM CORPORATION (JP) 2013-09-10 US disclosed
US-20120115333-A1 POLYBENZOXAZOLE PRECURSOR, PHOTOSENSITIVE RESIN COMPOSITION USING THE SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2012-05-10 US disclosed
US-8133550-B2 Good breaking elongation characteristics, achievable high sensitivity and high film remaining rate, little in pattern size fluctuation at the heating time after lithographic process, capable of stable pattern formation; manufacturing a semiconductor device FUJIFILM CORPORATION (JP) 2012-03-13 US disclosed
US-20110124772-A1 ANTIMICROBIAL POLYMERS AND THEIR USES DSM IP ASSETS B.V. (NL) 2011-05-26 US disclosed
US-7803510-B2 Positive photosensitive polybenzoxazole precursor compositions FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2010-09-28 US disclosed
US-20090197067-A1 Novel Positive Photosensitive Resin Compositions FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2009-08-06 US disclosed
EP-1266266-A1 NOVEL PHOTOSENSITIVE RESIN COMPOSITIONS ARCH SPECIALTY CHEMICALS, INC. (US) 2002-12-18 EP disclosed
EP-1171802-A4 NOVEL PHOTOSENSITIVE RESIN COMPOSITIONS ARCH SPEC CHEM INC (US) 2002-03-13 EP disclosed
EP-1171802-A1 NOVEL PHOTOSENSITIVE RESIN COMPOSITIONS Arch Specialty Chemicals, Inc. (US) 2002-01-16 EP disclosed
WO-2001073509-A1 NOVEL PHOTOSENSITIVE RESIN COMPOSITIONS ARCH SPECIALTY CHEMICALS, INC. (US) 2001-10-04 WO disclosed
US-6177225-B1 COMPRISING A CAPPED POLYBENZOXAZOLE PRECURSOR POLYMER, A PHOTOSENSITIVE AGENT, AND A SOLVENT ARCH SPECIALTY CHEMICALS, INC. 2001-01-23 US disclosed
WO-2000019275-A1 NOVEL PHOTOSENSITIVE RESIN COMPOSITIONS ARCH SPECIALTY CHEMICALS, INC. (US) 2000-04-06 WO disclosed
US-5834581-A Process for making polyimide-polyamic ester copolymers OLIN MICROELECTRONIC CHEMICALS, INC. (US) 1998-11-10 US disclosed
JP-H05311072-A POLYIMIDE RESIN COMPOSITION OF HIGH ADHESION SUMITOMO BAKELITE CO LTD 1993-11-22 JP disclosed
JP-H05140306-A PRODUCTION OF PARTIALLY IMIDATED POLYAMIC ACID COMPOSITION SUMITOMO BAKELITE CO LTD 1993-06-08 JP disclosed