SCHEMBL2738451

SCHEMBL2738451

CC(C)CCC1CCC2OC2C1

nearest known ligand 0.34

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
PIK3CD O00329 1/20 0.34
PTGS1 P23219 1/20 0.32
PTGS2 P35354 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL21904717 0.87 PIK3CD (0.32) PIK3CDPTGS1PTGS2
SCHEMBL18721787 0.83 PTGS1 (0.30) PTGS1PTGS2
SCHEMBL5703992 0.80 PTGS1 (0.37) PTGS1PTGS2
SCHEMBL12032236 0.79 PIK3CD (0.32) PIK3CD
SCHEMBL9720983 0.79 PTGS1 (0.33) PTGS1PTGS2
SCHEMBL1994161 0.78 PTGS1 (0.30) PTGS1PTGS2
SCHEMBL1470641 0.78 PTGS1 (0.30) PTGS1PTGS2
SCHEMBL1470651 0.78 PTGS1 (0.33) PTGS1PTGS2
SCHEMBL12632857 0.77
SCHEMBL20901395 0.77 PTGS1 (0.34) PTGS1PTGS2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 40 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11839476-B2 Bio-electrode composition, bio-electrode, and method for manufacturing a bio-electrode SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-12-12 US disclosed
US-20230320940-A1 PHOTOCATIONICALLY CURABLE COMPOSITION AND DENTAL CURABLE COMPOSITION TOKUYAMA DENTAL CORPORATION (JP) 2023-10-12 US disclosed
US-20230320940-A1 PHOTOCATIONICALLY CURABLE COMPOSITION AND DENTAL CURABLE COMPOSITION TOKUYAMA DENTAL CORPORATION (JP) 2023-10-12 US disclosed
US-20230148164-A1 WATER BASED ANTI-ABRASION COATING ESSILOR INTERNATIONAL (FR) 2023-05-11 US disclosed
US-20230148164-A1 WATER BASED ANTI-ABRASION COATING ESSILOR INTERNATIONAL (FR) 2023-05-11 US disclosed
US-20230130539-A1 EPOXY-CURABLE SILICONE RELEASE COATING COMPOSITION AND METHODS FOR ITS PREPARATION AND USE DOW SILICONES CORPORATION 2023-04-27 US disclosed
US-20160314991-A1 METHOD FOR PRODUCING COMPOSITION FOR FORMING COATING FILM FOR LITHOGRAPHY AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-10-27 US disclosed
US-9201304-B2 Pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-12-01 US disclosed
US-9138385-B2 Microemulsion of polysiloxanes containing quaternary ammonium groups, production and use thereof EVONIK DEGUSSA GMBH (DE) 2015-09-22 US disclosed
US-9086626-B2 Photo-patternable and developable silsesquioxane resins for use in device fabrication DOW CORNING CORPORATION (US) 2015-07-21 US disclosed
US-20080038662-A1 Bottom resist layer composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-02-14 US disclosed
US-20080032231-A1 Resist lower layer material, resist lower layer substrate comprising the material and method for forming pattern SHIN-ETSU CHEMICAL CO., LTD. 2008-02-07 US disclosed
US-7303785-B2 Antireflective film material, and antireflective film and pattern formation method using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-12-04 US disclosed
US-7303855-B2 Photoresist undercoat-forming material and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-12-04 US disclosed
US-20070172759-A1 Antireflection film composition, substrate, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-07-26 US disclosed
US-20070122740-A1 Resist undercoat-forming material and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-05-31 US disclosed
US-20070117411-A1 Rework process for photoresist film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-05-24 US disclosed
US-20070111134-A1 solvent remove the first photoresist film, forming a second photoresist film over the second antireflection silicone resin film which is over the first antireflection silicone resin film; lower cost and provide an excellent resist pattern SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-05-17 US disclosed
US-7202013-B2 Antireflective film material, and antireflective film and pattern formation method using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-04-10 US disclosed
US-7163778-B2 Anti-reflection film material and a substrate having an anti-reflection film and a method for forming a pattern SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-01-16 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20230320940-A1 PHOTOCATIONICALLY CURABLE COMPOSITION AND DENTAL CURABLE COMPOSITION CTH, GCLC, AAAS PIK3CD 3653/4885PTGS1 834/4885PTGS2 830/4885
US-11839476-B2 Bio-electrode composition, bio-electrode, and method for manufacturing a bio-electrode AFF1, AFF4, AFF2 PIK3CD 4079/4885PTGS1 1507/4885PTGS2 1958/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.