SCHEMBL27587041

SCHEMBL27587041

Oc1c(O)c(O)c2c(O)c(O)c(O)c(O)c2c1O

nearest known ligand 0.33

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
▸ PIM1 P11309 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL23637798 0.88 PIM1 (0.33) PIM1
SCHEMBL23049946 0.76 CA1 (0.50) —
SCHEMBL9350913 0.69 PIM1 (0.79) PIM1
SCHEMBL7559713 0.56 IGF1R (0.35) PIM1
SCHEMBL19373005 0.56 THRB (0.30) —
Phloroglucinol SCHEMBL5071422 0.56 BACE1 (0.80) PIM1
SCHEMBL19730540 0.56 TTR (0.33) —
SCHEMBL10826817 0.56 — —
SCHEMBL13199249 0.56 IGF1R (0.35) PIM1
SCHEMBL3058655 0.50 — —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-113631963-B Polyester carbonate resin and molded article obtained by molding resin composition containing same 三菱瓦斯化学株式会社 2022-11-18 — — CN disclosed
CN-113631963-A Polyester carbonate resin and molded article obtained by molding resin composition containing same 三菱瓦斯化学株式会社 2021-11-09 — — CN disclosed
CN-113075346-A Gas chromatography separation analysis method based on aromatic macrocycle, molecular cage and pillar quinone and application 天津师范大学 2021-07-06 — — CN disclosed
CN-101034256-B Resist pattern thickening material, resist pattern and forming process thereof, and semiconductor device and manufacturing process thereof FUJITSU LTD 2010-12-29 — — CN disclosed
CN-100478780-C Resist pattern thickening material, resist pattern and process for forming the same, and semiconductor device and process for manufacturing the same FUJITSU LTD (JP) 2009-04-15 — — CN disclosed
CN-101034256-A Resist pattern thickening material, resist pattern and forming process thereof, and semiconductor device and manufacturing process thereof FUJITSU LTD (JP) 2007-09-12 — — CN disclosed
CN-1421744-A Resist pattern thickening material, resist pattern and process for forming the same, and semiconductor device and process for manufacturing the same FUJITSU LTD (JP) 2003-06-04 — — CN disclosed
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