SCHEMBL2843489

SCHEMBL2843489

c1ccc(CCCCCc2ccccn2)nc1

nearest known ligand 0.80

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
HRH1 P35367 2/20 0.80
NAAA Q02083 1/20 0.65
HRH3 Q9Y5N1 3/20 0.57
CYP1A2 P05177 4/20 0.56
SMN1; SMN2 Q16637 2/20 0.56
CYP2C19 P33261 2/20 0.56
ALDH1A1 P00352 2/20 0.55
LMNA P02545 1/20 0.55
TAAR1 Q96RJ0 1/20 0.55
ALOX15 P16050 1/20 0.55
HRH4 Q9H3N8 2/20 0.55
CHRM2 P08172 1/20 0.53
CYP2D6 P10635 1/20 0.52
MAPT P10636 1/20 0.50
LIN28A Q9H9Z2 1/20 0.50
TDP1 Q9NUW8 1/20 0.50
HSD17B10 Q99714 1/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11734076 1.00 HRH1 (0.80) HRH1NAAAHRH3CYP1A2SMN1; SMN2
SCHEMBL31040594 1.00 HRH1 (0.80) HRH1NAAAHRH3CYP1A2SMN1; SMN2
SCHEMBL4418086 1.00 HRH1 (0.80) HRH1NAAAHRH3CYP1A2SMN1; SMN2
SCHEMBL659243 1.00 HRH1 (0.80) HRH1NAAAHRH3CYP1A2SMN1; SMN2
SCHEMBL726512 0.97 HRH1 (0.76) HRH1NAAAHRH3CYP1A2SMN1; SMN2
Hydrochloric Acid SCHEMBL5827595 0.95 HRH1 (0.73) HRH1NAAAHRH3CYP1A2SMN1; SMN2
SCHEMBL231470 0.92 HRH1 (0.69) HRH1NAAAHRH3CYP1A2SMN1; SMN2
SCHEMBL29485637 0.92 HRH1 (0.69) HRH1NAAAHRH3CYP1A2SMN1; SMN2
SCHEMBL31591272 0.91 HRH1 (0.69) HRH1NAAAHRH3CYP1A2SMN1; SMN2
SCHEMBL28566857 0.91 HRH1 (0.69) HRH1NAAAHRH3CYP1A2SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 24 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11697884-B2 Copper deposition in wafer level packaging of integrated circuits MACDERMID ENTHONE INC. (US) 2023-07-11 US disclosed
CN-114420633-A Copper deposition in wafer level packaging of integrated circuits 麦克德米德乐思公司 2022-04-29 CN disclosed
US-20210388519-A1 Copper Deposition in Wafer Level Packaging of Integrated Circuits MACDERMID ENTHONE INC. 2021-12-16 US disclosed
US-11124888-B2 Copper deposition in wafer level packaging of integrated circuits MACDERMID ENTHONE INC. (US) 2021-09-21 US disclosed
EP-3504186-A1 COPPER DEPOSITION IN WAFER LEVEL PACKAGING OF INTEGRATED CIRCUITS MacDermid Enthone Inc. (US) 2019-07-03 EP disclosed
US-10221496-B2 Copper filling of through silicon vias MACDERMID ENTHONE INC. (US) 2019-03-05 US disclosed
US-20190003068-A9 COPPER FILLING OF THROUGH SILICON VIAS ENTHONE INC. (US) 2019-01-03 US disclosed
US-20180355502-A1 PROCESS FOR METALIZATION OF COPPER PILLARS IN THE MANUFACTURE OF MICROELECTRONICS CITIBANK, N.A. 2018-12-13 US disclosed
WO-2018226988-A1 PROCESS FOR FILLING VIAS IN THE MANUFACTURE OF MICROELECTRONICS MACDERMID ENTHONE INC. (US) 2018-12-13 WO disclosed
US-10103029-B2 Process for filling vias in the microelectronics MACDERMID ENTHONE INC. (US) 2018-10-16 US disclosed
US-20140322912-A1 METHOD AND COMPOSITION FOR ELECTRODEPOSITION OF COPPER IN MICROELECTRONICS WITH DIPYRIDYL-BASED LEVELERS ENTHONE INC. (US) 2014-10-30 US disclosed
US-8771495-B2 Method and composition for electrodeposition of copper in microelectronics with dipyridyl-based levelers ENTHONE INC. (US) 2014-07-08 US disclosed
US-20140120722-A1 PROCESS FOR FILLING VIAS IN THE MICROELECTRONICS ENTHONE INC. (US) 2014-05-01 US disclosed
CN-103492617-A Process for filling vias in the microelectronics ENTHONE 2014-01-01 CN disclosed
US-20130241060-A1 METHOD AND COMPOSITION FOR ELECTRODEPOSITION OF COPPER IN MICROELECTRONICS WITH DIPYRIDYL-BASED LEVELERS ENTHONE INC. (US) 2013-09-19 US disclosed
US-20130199935-A1 COPPER FILLING OF THROUGH SILICON VIAS ENTHONE INC. (US) 2013-08-08 US disclosed
US-8388824-B2 Method and composition for electrodeposition of copper in microelectronics with dipyridyl-based levelers ENTHONE INC. (US) 2013-03-05 US disclosed
US-20100126872-A1 ELECTRODEPOSITION OF COPPER IN MICROELECTRONICS WITH DIPYRIDYL-BASED LEVELERS ENTHONE, INC. (US) 2010-05-27 US disclosed
EP-1563047-A1 USE OF METAL COMPLEX COMPOUNDS AS OXIDATION CATALYSTS Reckitt Benckiser N.V. (NL) 2005-08-17 EP disclosed
WO-2004039932-A1 USE OF METAL COMPLEX COMPOUNDS AS OXIDATION CATALYSTS RECKITT BENCKISER N.V. (NL) 2004-05-13 WO disclosed