SCHEMBL2923227

SCHEMBL2923227

C[CH]c1cccc(OC2CCCCCC2)c1

nearest known ligand 0.40

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
HDAC4 P56524 2/20 0.40
MEF2D Q14814 2/20 0.40
SLC6A2 P23975 2/20 0.39
SLC6A4 P31645 2/20 0.39
SLC6A3 Q01959 2/20 0.39
MEN1 O00255 1/20 0.39
KMT2A Q03164 1/20 0.39
HPGD P15428 1/20 0.38
MTNR1A P48039 1/20 0.38
PDK2 Q15119 1/20 0.38
NPC1 O15118 1/20 0.38
CASP3 P42574 1/20 0.38
RAB9A P51151 1/20 0.38
SENP8 Q96LD8 1/20 0.38
SENP7 Q9BQF6 1/20 0.38
SENP6 Q9GZR1 1/20 0.38
KAT6A Q92794 1/20 0.38
CHRNB4 P30926 2/20 0.38
CHRNA3 P32297 2/20 0.38
CHRNA7 P36544 2/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL676970 1.00 HDAC4 (0.40) HDAC4MEF2DSLC6A2SLC6A4SLC6A3
SCHEMBL677449 1.00 HDAC4 (0.40) HDAC4MEF2DSLC6A2SLC6A4SLC6A3
SCHEMBL676949 0.98 HDAC4 (0.41) HDAC4MEF2DSLC6A2SLC6A4SLC6A3
SCHEMBL3748275 0.83 SRC (0.46) HDAC4MEF2DMEN1KMT2AHPGD
SCHEMBL5744737 0.83 SRC (0.46) HDAC4MEF2DMEN1KMT2AHPGD
SCHEMBL5033499 0.83 HDAC4 (0.40) HDAC4MEF2DSLC6A2SLC6A4SLC6A3
SCHEMBL11663045 0.82 SLC6A4 (0.47) SLC6A2SLC6A4SLC6A3MEN1KMT2A
SCHEMBL3893959 0.81 SRC (0.47) HDAC4MEF2DKMT2AHPGDNPC1
SCHEMBL15496944 0.81 HDAC4 (0.41) HDAC4MEF2DSLC6A2SLC6A4SLC6A3
SCHEMBL21459754 0.79 SRC (0.49) HDAC4MEF2DKMT2AHPGDNPC1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1467251-B1 Positive resist composition FUJIFILM CORP (JP) 2010-09-08 EP disclosed
US-20080096130-A1 POSITIVE RESIST COMPOSITION FUJIFILM CORPORATION 2008-04-24 US disclosed
US-7361446-B2 Sensitivity, high resolution, good pattern profile, used for super-microlithography FUJIFILM CORPORATION (JP) 2008-04-22 US disclosed
EP-1467251-A1 Positive resist composition Fuji Photo Film Co., Ltd. (JP) 2004-10-13 EP disclosed
US-20040197702-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2004-10-07 US disclosed
US-6727033-B2 A POSITIVE RESIST COMPOSITION COMPRISING A RESIN (A), WHICH IS DECOMPOSED BY THE ACTION OF AN ACID TO INCREASE SOLUBILITY IN AN ALKALI DEVELOPING SOLUTION, CONTAINING A STRUCTURAL UNIT INCLUDING A GROUP REPRESENTED BY FORMULA (X) DEFINED IN FUJI PHOTO FILM CO., LTD. (JP) 2004-04-27 US disclosed
US-20030134221-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2003-07-17 US disclosed