SCHEMBL29350002

SCHEMBL29350002

CC(C)C[C@H](NC(=O)[C@@H](N)CC(=O)O)C(=O)N[C@H](C(=O)N[C@@H](CO)C(=O)O)[C@@H](C)O

nearest known ligand 0.54

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
MME P08473 4/20 0.54
BACE1 P56817 7/20 0.43
BACE2 Q9Y5Z0 1/20 0.43
OPRM1 P35372 1/20 0.42
OPRD1 P41143 1/20 0.42
TASP1 Q9H6P5 1/20 0.42
CTSD P07339 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30930193 0.93 MME (0.47) MMEBACE1BACE2CTSD
SCHEMBL29466705 0.93 BACE1 (0.47) MMEBACE1BACE2CTSD
SCHEMBL29386907 0.92 MME (0.51) MME
SCHEMBL30099600 0.91 MME (0.56) MMEBACE1BACE2CTSD
SCHEMBL30788029 0.91 BACE1 (0.48) MMEBACE1BACE2CTSD
SCHEMBL29544149 0.91 MME (0.56) MMEBACE1BACE2CTSD
SCHEMBL29598616 0.91 MME (0.64) MMETASP1
SCHEMBL29364915 0.90 MME (0.47) MMEBACE1
SCHEMBL29710513 0.90 MME (0.51) MMEBACE1OPRM1OPRD1CTSD
SCHEMBL31319509 0.89 OPRM1 (0.46) MMEBACE1BACE2OPRM1OPRD1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 3868 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12622027-B2 Silicon carbide wafer and silicon carbide semiconductor device including the same DENSO CORPORATION (JP) 2026-05-05 US claimed
EP-4552280-B1 A SYSTEM AND METHOD FOR THE CONSISTENCY AND CORRECTNESS OF STORAGE AND DATABASE MANAGEMENT OPERATIONS AMONG DATA ENTITIES AND THEIR HASHED KEY VALUES QPQ LTD (IE) 2026-04-15 EP claimed
CN-121586401-A Beta-Ga is promoted in low energy proton irradiation2O3Technological method for device performance 哈尔滨工业大学 2026-02-27 CN claimed
EP-4680005-A1 DOSING UNIT FOR AN AGRICULTURAL SPREADING MACHINE AND METHOD FOR DOSING Amazonen-Werke H. Dreyer SE & Co. KG (DE) 2026-01-21 EP claimed
US-20250373410-A1 A SYSTEM AND METHOD FOR THE CONSISTENCY AND CORRECTNESS OF STORAGE AND DATABASE MANAGEMENT OPERATIONS AMONG DATA ENTITIES AND THEIR HASHED KEY VALUES QPQ LTD (IE) 2025-12-04 US claimed
US-12470598-B2 Browser impersonator detection (BID) system AKAMAI TECHNOLOGIES, INC. (US) 2025-11-11 US claimed
WO-2025217035-A2 USE OF ANTI-HA-1 AND ANTI-HA-2 BINDING PROTEINS FOR TREATMENT OF AML, ALL, AND MDS TSCAN THERAPEUTICS, INC. (US) 2025-10-16 WO claimed
EP-4552280-A1 A SYSTEM AND METHOD FOR THE CONSISTENCY AND CORRECTNESS OF STORAGE AND DATABASE MANAGEMENT OPERATIONS AMONG DATA ENTITIES AND THEIR HASHED KEY VALUES QPQ Ltd. (IE) 2025-05-14 EP claimed
CN-119788754-A Method, device and electronic equipment for secure transmission of SOME/IP protocol data based on TLS/DTLS 东软睿驰汽车技术(沈阳)有限公司 2025-04-08 CN claimed
US-20240430242-A1 KEY REPLACEMENT DURING DATAGRAM TRANSPORT LAYER SECURITY (DTLS) CONNECTIONS OVER STREAM CONTROL TRANSMISSION PROTOCOL (SCTP) TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) (SE) 2024-12-26 US claimed
CN-112640071-B Method for evaluating carbon concentration of silicon sample, method for evaluating silicon wafer production process, method for producing silicon wafer, and method for producing silicon single crystal ingot 胜高股份有限公司 2023-09-15 CN claimed
CN-108886005-B Method for measuring carbon concentration of silicon sample, method for producing silicon single crystal ingot, and silicon wafer 胜高股份有限公司 2023-06-06 CN claimed
CN-112666438-B Sample preparation and optimization method for researching silicon carbide MOS interface state by DLTS 中国科学院半导体研究所 2023-06-06 CN claimed
WO-2023067400-A1 KEY REPLACEMENT DURING DATAGRAM TRANSPORT LAYER SECURITY (DTLS) CONNECTIONS OVER STREAM CONTROL TRANSMISSION PROTOCOL (SCTP) TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) (SE) 2023-04-27 WO claimed
CN-115825682-A Method for detecting deep energy level defect of detector-grade high-purity germanium single crystal 安徽光智科技有限公司 2023-03-21 CN claimed
CN-112786472-B Deep energy level transient spectrum testing method for dielectric temperature coefficient correction 电子科技大学 2023-01-10 CN claimed
CN-114970148-A Quantitative simulation method and system for irradiated semiconductor deep energy level transient spectrum 中国科学院合肥物质科学研究院 2022-08-30 CN claimed
EP-4000284-A1 PROCEDURE OF UNIFIED GLOBAL REGISTRATION AND UNIVERSAL IDENTIFICATION OF SPATIALLY LOCATABLE OBJECTS Conéctate Soluciones Y Aplicaciones SL (ES) 2022-05-25 EP claimed
CN-114402633-A Program for unified global registration and universal recognition of spatially locatable objects 连接解决方案和应用公司 2022-04-26 CN claimed
CN-113555117-B Driver health management system based on wearable device 江苏金海星导航科技有限公司 2022-04-01 CN claimed