SCHEMBL30528

SCHEMBL30528

C/C(=C\Cc1ccccc1)C(=O)O

nearest known ligand 0.51

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CYP2C9 P11712 2/20 0.51
AKR1C3 P42330 1/20 0.50
ALDH1A1 P00352 4/20 0.45
MAOB P27338 1/20 0.44
LMNA P02545 2/20 0.42
CES2 O00748 1/20 0.41
CES1 P23141 1/20 0.41
AKR1B1 P15121 1/20 0.41
TOP1 P11387 1/20 0.41
SMN1; SMN2 Q16637 2/20 0.40
CYP3A4 P08684 1/20 0.40
NPC1 O15118 1/20 0.40
RAB9A P51151 1/20 0.40
HPGD P15428 2/20 0.40
CA1 P00915 1/20 0.39
CA2 P00918 1/20 0.39
ARG2 P78540 1/20 0.39
ALPI P09923 1/20 0.39
PKM P14618 1/20 0.39
PTGS1 P23219 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30530 1.00 CYP2C9 (0.51) CYP2C9AKR1C3ALDH1A1MAOBLMNA
Iodide SCHEMBL3761279 0.98 CYP2C9 (0.50) CYP2C9AKR1C3ALDH1A1MAOBLMNA
SCHEMBL6736205 0.94 CYP2C9 (0.47) CYP2C9AKR1C3ALDH1A1MAOBLMNA
SCHEMBL6736212 0.94 CYP2C9 (0.47) CYP2C9AKR1C3ALDH1A1MAOBLMNA
Biphenyl SCHEMBL28243732 0.94 CYP2C9 (0.47) CYP2C9AKR1C3ALDH1A1MAOBLMNA
Methacrylic Acid SCHEMBL3739483 0.93 CYP2C9 (0.46) CYP2C9AKR1C3ALDH1A1MAOBLMNA
Methacrylic Acid SCHEMBL1082310 0.93 CYP2C9 (0.46) CYP2C9AKR1C3ALDH1A1MAOBLMNA
SCHEMBL19097596 0.93 LMNA (0.55) CYP2C9AKR1C3ALDH1A1MAOBLMNA
Methacrylic Acid SCHEMBL1082313 0.93 CYP2C9 (0.46) CYP2C9AKR1C3ALDH1A1MAOBLMNA
SCHEMBL19097595 0.93 LMNA (0.55) CYP2C9AKR1C3ALDH1A1MAOBLMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 4558 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4534627-B1 QUANTUM DOT COMPOSITION, METHOD OF MANUFACTURING THE SAME, CURED PRODUCT THEREOF, AND DISPLAY DEVICE INCLUDING THE SAME SAMSUNG ELECTRONICS CO LTD (KR) 2026-05-20 EP claimed
US-20260132302-A1 INKJET INK KYOCERA DOCUMENT SOLUTIONS INC (JP) 2026-05-14 US claimed
US-20260103623-A1 TWO-PART, CYANOACRYLATE/FREE RADICALLY CURABLE ADHESIVE SYSTEMS HENKEL AG & CO KGAA (DE) 2026-04-16 US claimed
EP-4724508-A1 COATING COLOR COMPOSITION Coatex (FR) 2026-04-15 EP claimed
US-20260098164-A1 INKJET INK KYOCERA DOCUMENT SOLUTIONS INC (JP) 2026-04-09 US claimed
EP-4476297-B1 PRESSURE-SENSITIVE ADHESIVE COMPOSITION WITH IMPROVED CHEMICAL RESISTANCE TESA SE (DE) 2026-04-01 EP claimed
EP-4717740-A1 INKJET INK KYOCERA Document Solutions Inc. (JP) 2026-04-01 EP claimed
US-20260085202-A1 INKJET INK KYOCERA DOCUMENT SOLUTIONS INC (JP) 2026-03-26 US claimed
EP-3423506-B1 STYRENE-FREE REACTIVE DILUENTS FOR URETHANE ACRYLATE RESIN COMPOSITIONS DOW GLOBAL TECHNOLOGIES LLC (US) 2026-03-25 EP claimed
EP-3642276-B1 POLYVINYL CHLORIDE COMPOSITIONS CONTAINING IMPACT MODIFIERS AND CALCIUM CARBONATE DOW GLOBAL TECHNOLOGIES LLC (US) 2026-03-25 EP claimed
EP-0067067-B1 DRY-DEVELOPING NEGATIVE RESIST COMPOSITION FUJITSU LIMITED (JP) 1985-09-25 EP claimed
EP-0079057-B1 PRESENSITIZED LITHOGRAPHIC PRINTING PLATES FUJI PHOTO FILM CO., LTD. (JP) 1985-09-11 EP claimed
EP-0082204-B1 PLASTIC LENS WITH HIGH REFRACTIVE INDEX HOYA LENS CORPORATION (JP) 1985-08-21 EP claimed
EP-0115066-A2 Moulding Material based on acrylic resins with slight water absorption Röhm GmbH (DE) 1984-08-08 EP claimed
US-4405707-A Method of producing relief structures for integrated semiconductor circuits SIEMENS AKTIENGESELLSCHAFT (DE) 1983-09-20 US claimed
EP-0082204-A1 PLASTIC LENS WITH HIGH REFRACTIVE INDEX HOYA LENS CORPORATION (JP) 1983-06-29 EP claimed
US-4388399-A ALCOHOL-SOLUBLE POLYAMIDE BLEND WITH OTHER POLYMER UNDER PHOTORESIST LAYER FUJI PHOTO FILM CO., LTD. (JP) 1983-06-14 US claimed
EP-0006938-B1 POSITIVE TYPE RESIST POLYMER COMPOSITION AND METHOD OF MAKING RESIST PATTERNS FUJITSU LIMITED (JP) 1982-08-04 EP claimed
EP-0006939-B1 POSITIVE TYPE RESIST POLYMER COMPOSITION AND METHOD OF MAKING RESIST PATTERNS FUJITSU LIMITED (JP) 1982-07-28 EP claimed
US-4306780-A Highly refractive copolymer of an ethylinically unsaturated alkylene oxide of bis-phenol-A and an ethylinically unsaturated aromatic compound for lens and a lens prepared therefrom HOYA LENS CORPORATION (JP) 1981-12-22 US claimed