SCHEMBL3100372

SCHEMBL3100372

CCNCCNC(C)(C)O

nearest known ligand 0.39

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
CYP2C19 P33261 2/20 0.39
MEN1 O00255 1/20 0.39
GLA P06280 1/20 0.39
KMT2A Q03164 1/20 0.39
CYP1A2 P05177 1/20 0.38
TSHR P16473 1/20 0.38
TP53 P04637 1/20 0.35
SAT1 P21673 2/20 0.32
KDM1A O60341 5/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7084623 0.83 ALDH1A1 (0.35)
SCHEMBL13078382 0.80 CYP2C19 (0.45) CYP2C19MEN1GLAKMT2ACYP1A2
SCHEMBL28354717 0.75 CA12 (0.52) CYP2C19MEN1KMT2ACYP1A2TSHR
SCHEMBL9950060 0.75 CA12 (0.52) CYP2C19MEN1KMT2ACYP1A2TSHR
SCHEMBL1720452 0.75
SCHEMBL1061677 0.74
SCHEMBL80292 0.72
SCHEMBL3107552 0.72
SCHEMBL339968 0.70
SCHEMBL4667751 0.70

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-102272675-A A photoresist image-forming process using double patterning 2011-12-07 CN claimed
US-20100183851-A1 Photoresist Image-forming Process Using Double Patterning CAO YI 2010-07-22 US claimed
EP-2146250-B1 WATER-SOLUBLE RESIN COMPOSITION FOR THE FORMATION OF MICROPATTERNS AND PROCESS FOR THE FORMATION OF MICROPATTERNS WITH THE SAME MERCK PATENT GMBH (DE) 2017-08-23 EP disclosed
CN-101675390-B Water-soluble resin composition for the formation of micropatterns and process for the formation of micropatterns with the same AZ ELECTRONIC MATERIALS JAPAN 2012-07-18 CN disclosed
CN-102272675-A A photoresist image-forming process using double patterning 2011-12-07 CN disclosed
US-20100183851-A1 Photoresist Image-forming Process Using Double Patterning CAO YI 2010-07-22 US disclosed
US-20100119717-A1 WATER-SOLUBLE RESIN COMPOSITION FOR THE FORMATION OF MICROPATTERNS AND METHOD FOR THE FORMATION OF MICROPATTERNS WITH THE SAME HONG SUNG-EUN 2010-05-13 US disclosed
CN-101675390-A Water-soluble resin composition for the formation of micropatterns and process for the formation of micropatterns with the same AZ ELECTRONIC MATERIALS JAPAN 2010-03-17 CN disclosed
EP-2146250-A1 WATER-SOLUBLE RESIN COMPOSITION FOR THE FORMATION OF MICROPATTERNS AND PROCESS FOR THE FORMATION OF MICROPATTERNS WITH THE SAME AZ Electronic Materials (Japan) K.K. (JP) 2010-01-20 EP disclosed